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S/UNI-JET Data Sheet
Released
Proprietary and Confidential to PMC-Sierra, Inc., and for its Customers’ Internal Use
Document ID: PMC-1990267, Issue 3
251
Address
Register
783H
TXCP-50 Test Register 3
784H
TXCP-50 Test Register 4
785H
TXCP-50 Test Register 5
786H-78FH
Reserved
790H
TTB Test Register 0
791H
TTB Test Register 1
792H
TTB Test Register 2
793H-797H
Reserved
798H
RBOC Test Register 0
799H
RBOC Test Register 1
79AH
XBOC Test Register 1
79BH
XBOC Test Register 0
79CH-79FH
Reserved
7A0H
PRGD Test Register 0
7A1H
PRGD Test Register 1
7A2H
PRGD Test Register 2
7A3H
PRGD Test Register 3
7A4H-7FFH
Reserved
Notes
1. Although writing values into unused register bits has no effect, it is recommended, to ensure software
compatibility with future, feature-enhanced versions of the device, to write unused register bits with logic
zero. Reading back unused bits can produce either a logic one or a logic zero; therefore, unused
register bits should be masked off by software when read.
2. Writable test mode register bits are not initialized upon reset unless otherwise noted.
12.1
Test Mode 0 Details
In test mode 0, the S/UNI-JET allows the logic levels on the device inputs to be read through the
microprocessor interface and allows the device outputs to be forced to either logic level through
the microprocessor interface. The IOTST bit in the S/UNI-JET Master Test Register must be set
to logic one to access the device I/O.
To enable test mode 0, the IOTST bit in the S/UNI-JET Master Test Register is set to logic one
and the device should be left in its default state after reset unless otherwise noted. All Test
Register 1 locations of all blocks must be written with the value 0. Refer to Table 27.
Reading the address locations shown in Table 28 returns the values on the indicated inputs:
Table 28 Test Mode 0 Input Read Address Locations
Addr
Bit 7
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
Bit 0
40CH
Device_ID
430H