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參數(shù)資料
| 型號(hào)： | RF1K4915796 |
| 英文描述： | TRANSISTOR | MOSFET | N-CHANNEL | 30V V(BR)DSS | 6.3A I(D) | SO |
| 中文描述： | 晶體管| MOSFET的| N溝道| 30V的五（巴西）直| 6.3AI（四）|蘇 |
| 文件頁(yè)數(shù)： | 6/8頁(yè) |
| 文件大?。?/td> | 262K |
| 代理商： | RF1K4915796 |
2002 Fairchild Semiconductor Corporation
RF1K49093 Rev. B
Soldering Precautions
The soldering process creates a considerable thermal stress
on any semiconductor component. The melting temperature
of solder is higher than the maximum rated temperature of
the device. The amount of time the device is heated to a high
temperature should be minimized to assure device reliability.
Therefore, the following precautions should always be
observed in order to minimize the thermal stress to which the
devices are subjected.
1. Always preheat the device.
2. The delta temperature between the preheat and soldering
should always be less than 100
o
C. Failure to preheat the
device can result in excessive thermal stress which can
damage the device.
3. The maximum temperature gradient should be less than 5
o
C
per second when changing from preheating to soldering.
4. The peak temperature in the soldering process should be
at least 30
o
C higher than the melting point of the solder
chosen.
5. The maximum soldering temperature and time must not
exceed 260
o
C for 10 seconds on the leads and case of
the device.
6. After soldering is complete, the device should be allowed
to cool naturally for at least three minutes, as forced cool-
ing will increase the temperature gradient and may result
in latent failure due to mechanical stress.
7. During cooling, mechanical stress or shock should be
avoided.
FIGURE 18. SWITCHING TIME TEST CIRCUIT
FIGURE 19. RESISTIVE SWITCHING WAVEFORMS
FIGURE 20. GATE CHARGE TEST CIRCUIT
FIGURE 21. GATE CHARGE WAVEFORMS
Test Circuits and Waveforms
(Continued)
V
GS
R
L
R
G
DUT
+
-
V
DD
t
d(ON)
t
r
90%
10%
V
DS
90%
t
f
t
d(OFF)
t
OFF
90%
50%
50%
10%
PULSE WIDTH
V
GS
0
t
ON
10%
0
0.3
μ
F
12V
BATTERY
50k
+V
DS
S
DUT
D
G
I
g(REF)
0
(ISOLATED
SUPPLY)
-V
DS
0.2
μ
F
CURRENT
REGULATOR
I
D
CURRENT
SAMPLING
RESISTOR
I
G
CURRENT
SAMPLING
RESISTOR
DUT
V
DD
Q
g(TH)
V
GS
= -1V
Q
g(-5)
V
GS
= -5V
Q
g(TOT)
V
GS
= -10V
V
DS
-V
GS
I
g(REF)
0
0
RF1K49093
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