參數(shù)資料
型號(hào): SAA4978H
廠商: NXP SEMICONDUCTORS
元件分類: 消費(fèi)家電
英文描述: Picture Improved Combined Network PICNIC
中文描述: SPECIALTY CONSUMER CIRCUIT, PQFP160
封裝: 28 X 28 MM, 3.40 MM HEIGHT, PLASTIC, MS-022, SOT-322-2, QFP-160
文件頁(yè)數(shù): 6/56頁(yè)
文件大?。?/td> 296K
代理商: SAA4978H
1999 May 03
6
Philips Semiconductors
Product specification
Picture Improved Combined Network
(PICNIC)
SAA4978H
6
PINNING INFORMATION
SYMBOL
PIN
DESCRIPTION
SNDA
SNCL
V
SSO6
SCL
SDA
RST
WDRST
RSTW
RSTR
FBL
V
DDA1
YOUT
V
SSA1
UOUT
VOUT
V
SSA2
BGEXT
HDFL
VDFL
AGND
DIFFIN
V
DDA2
YIN
V
DDA3
UIN
VIN
V
SSA3
HA
VA
HREFEXT
V
DDA4
V
SSA4
V
SSX
OSCI
OSCO
TEST
TRST
TMS
TDI
TDO
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
SNERT data input/output
SNERT clock output
digital microcontroller I/O ground 6; internally connected to all other V
SSO
pins
I
2
C-bus serial clock input (P1.6)
I
2
C-bus serial data input/output (P1.7)
microcontroller reset input
watchdog reset output
reset write signal output/SNERT reset (only PALplus) Port 1.2
reset read signal output/SNERT reset (SAA4991WP or SAA4992H) Port 1.3
fast blanking input to PSP and Port 1.4
analog back-end supply voltage 1
Y analog output
analog back-end ground 1
U analog output
V analog output
analog input ground 2; internally connected to substrate
band gap external/reference currents input
horizontal synchronization signal output, deflection part
vertical synchronization signal output, deflection part
analog ground
differential Y input
analog input supply voltage 2
Y analog input
analog input supply voltage 3
U analog input
V analog input
analog input ground 3; internally connected to substrate
horizontal synchronization input, acquisition part
vertical synchronization input, acquisition part
horizontal reference external output
analog PLL supply voltage 4
analog PLL ground 4; internally connected to substrate
oscillator ground
oscillator input
oscillator output
test input/external 32 MHz clock input
BST reset input
BST test mode select input
BST test data input
BST test data output
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