參數(shù)資料
型號(hào)： SAH-XC2387A-104F80L
廠商： INFINEON TECHNOLOGIES AG
元件分類： 微控制器/微處理器
英文描述： 16-BIT, FLASH, 80 MHz, RISC MICROCONTROLLER, PQFP144
封裝： 0.50 MM PITCH, GREEN, PLASTIC, LQFP-144
文件頁數(shù)： 139/141頁
文件大?。?/td> 1795K
代理商： SAH-XC2387A-104F80L
XC2385A, XC2387A
XC2000 Family / Base Line
Electrical Parameters
Data Sheet
97
V2.1, 2011-07
Broken wire detection
delay against VAGND
2)
t
BWG CC
50
3)
Broken wire detection
delay against VAREF
t
BWR CC
50
4)
Conversion time for 8-bit
t
c8 CC
(11 + STC) x
t
ADCI
+ 2 x
t
SYS
Conversion time for 10-bit
t
c10 CC
(13 + STC) x
t
ADCI
+ 2 x
t
SYS
Total Unadjusted Error
|TUE|
CC
12
LSB
5)
Wakeup time from analog
powerdown, fast mode
t
WAF CC
4
μs
Wakeup time from analog
powerdown, slow mode
t
WAS CC
15
μs
Analog reference ground
V
AGND
SR
V
SS
- 0.05
1.5
V
Analog input voltage
range
V
AIN SR
V
AGND
V
AREF
V
6)
Analog reference voltage
V
AREF
SR
V
AGND
+ 1.0
V
DDPA
+ 0.05
V
1) These parameter values cover the complete operating range. Under relaxed operating conditions (room
temperature, nominal supply voltage) the typical values can be used for calculation.
2) This parameter includes the sample time (also the additional sample time specified by STC), the time to
determine the digital result and the time to load the result register with the conversion result. Values for the
basic clock
t
ADCI depend on programming.
3) The broken wire detection delay against
V
AGND is measured in numbers of consecutive precharge cycles at a
conversion rate of not more than 500 s. Result below 10% (66
H).
4) The broken wire detection delay against
V
AREF is measured in numbers of consecutive precharge cycles at a
conversion rate of not more than 10 s. This function is influenced by leakage current, in particular at high
temperature. Result above 80% (332
H).
5) TUE is tested at
V
AREF = VDDPA = 5.0 V, VAGND = 0 V. It is verified by design for all other voltages within the
defined voltage range. The specified TUE is valid only if the absolute sum of input overload currents on analog
port pins (see
I
OV specification) does not exceed 10 mA, and if VAREF and VAGND remain stable during the
measurement time.
6)
V
AIN may exceed VAGND or VAREF up to the absolute maximum ratings. However, the conversion result in these
cases will be X000
H or X3FFH, respectively.
Table 18
ADC Parameters
(cont’d)
Parameter
Symbol
Values
Unit
Note /
Test Condition
Min.
Typ.
Max.
相關(guān)PDF資料
PDF描述
SAH-XC2387C-200F100L 32-BIT, FLASH, 100 MHz, RISC MICROCONTROLLER, PQFP144
SAH-XC2387C-136F100L 32-BIT, FLASH, 100 MHz, RISC MICROCONTROLLER, PQFP144
SAH-XC2387C-104F100L 32-BIT, FLASH, 100 MHz, RISC MICROCONTROLLER, PQFP144
SAF-XC2387C-200F80L 32-BIT, FLASH, 80 MHz, RISC MICROCONTROLLER, PQFP144
SAF-XC2387C-200F100L 32-BIT, FLASH, 100 MHz, RISC MICROCONTROLLER, PQFP144
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