參數(shù)資料
型號(hào)： SAK-TC1782-320F180HL
廠商： INFINEON TECHNOLOGIES AG
元件分類： 微控制器/微處理器
英文描述： 32-BIT, FLASH, 180 MHz, RISC MICROCONTROLLER, PQFP176
封裝： GREEN, PLASTIC, LQFP-176
文件頁(yè)數(shù)： 4/113頁(yè)
文件大?。?/td> 3371K
代理商： SAK-TC1782-320F180HL
TC1782
Electrical ParametersPackage and Reliability
Target Data Sheet/ACDC Target Specification 60
V 0.7 Preliminary, 2010-03
The following constraints regarding FLASH performance apply additionally for
3.0 V
<V
DDP < 3.13 V (- 5% to - 10%) on VDDP pin:
no program / delete of DFLASH for
T
J > 125
oC, no program / delete of PFLASH at all.
1.4.4
Quality Declarations
3) Only valid when a robust EEPROM emulation algorithm is used. For more details see the Users Manual.
4) Storage and inactive time included.
5) At average weighted junction temperature
T
j = 100°C, or the retention time at average weighted temperature
of
T
j = 110°C is minimum 10 years, or the retention time at average weighted temperature of Tj = 150°C is
minimum 0.7 years.
Table 30
Quality Parameters
Parameter
Symbol
Values
Unit
Note / Test Condition
Min. Typ. Max.
Operation
Lifetime
1)
1) This lifetime refers only to the time when the device is powered on.
t
OP
–
24000 hours –
2)
2) For worst-case temperature profile equivalent to:
1200 hours at
T
j = 125...150
oC
3600 hours at
T
j = 110...125
oC
7200 hours at
T
j = 100...110
oC
11000 hours at
T
j = 25...110
oC
1000 hours at
T
j = -40...25
oC
ESD susceptibility
according to
Human Body
Model (HBM)
V
HBM
–
2000
V
Conforming to
JESD22-A114-B
ESD susceptibility
of the LVDS pins
V
HBM1
––
500
V
–
ESD susceptibility
according to
Charged Device
Model (CDM)
V
CDM
–
500
V
Conforming to
JESD22-C101-C
Moisture
Sensitivity Level
MSL
–
3
–
Conforming to Jedec
J-STD-020C for 240°C
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