參數(shù)資料
型號(hào)： SAK-XC2285M-56F80LAA
廠商： INFINEON TECHNOLOGIES AG
元件分類： 微控制器/微處理器
英文描述： RISC MICROCONTROLLER, PQFP144
封裝： 0.50 mm pitch, GREEN, PLASTIC, LQFP-144
文件頁數(shù)： 5/142頁
文件大?。?/td> 1112K
代理商： SAK-XC2285M-56F80LAA
XC2287M, XC2286M, XC2285M
XC2000 Family Derivatives / Base Line
Electrical Parameters
Data Sheet
102
V2.0, 2009-03
Total capacitance
of an analog input
C
AINT CC
––10
pF
8)9)
Switched capacitance
of an analog input
C
AINS CC
––4
pF
Resistance of
the analog input path
R
AIN CC
––2
k
Ω
Total capacitance
of the reference input
C
AREFT
CC
––15
pF
Switched capacitance
of the reference input
C
AREFS
CC
––7
pF
Resistance of
the reference input path
R
AREF CC
––2
k
Ω
1) TUE is tested at
VAREFx = VDDPA, VAGND = 0 V. It is verified by design for all other voltages within the defined
voltage range.
The specified TUE is valid only if the absolute sum of input overload currents on Port 5 or Port 15 pins (see
IOV specification) does not exceed 10 mA, and if VAREF and VAGND remain stable during the measurement time.
2)
VAIN may exceed VAGND or VAREFx up to the absolute maximum ratings. However, the conversion result in these
cases will be X000H or X3FFH, respectively.
3) The limit values for
fADCI must not be exceeded when selecting the peripheral frequency and the prescaler
setting.
4) This parameter includes the sample time (also the additional sample time specified by STC), the time to
determine the digital result and the time to load the result register with the conversion result.
Values for the basic clock
tADCI depend on programming and are found in Table 19.
5) The broken wire detection delay against
VAGND is measured in numbers of consecutive precharge cycles at a
conversion rate of not more than 500
μs.
6) The broken wire detection delay against
VAREF is measured in numbers of consecutive precharge cycles at a
conversion rate of not more than 10
μs. This function is influenced by leakage current, in particular at high
temperature.
7) The total unadjusted error TUE is the maximum deviation from the ideal ADC transfer curve, not the sum of
individual errors.
All error specifications are based on measurement methods standardized by IEEE 1241.2000.
8) Not subject to production test - verified by design/characterization.
9) These parameter values cover the complete operating range. Under relaxed operating conditions
(temperature, supply voltage) typical values can be used for calculation. At room temperature and nominal
supply voltage the following typical values can be used:
CAINTtyp = 12 pF, CAINStyp = 5 pF, RAINtyp = 1.0 kΩ, CAREFTtyp = 15 pF, CAREFStyp = 10 pF, RAREFtyp = 1.0 kΩ.
Table 18
A/D Converter Characteristics (cont’d)
Parameter
Symbol
Limit Values
Unit Test
Condition
Min.
Typ.
Max.
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