參數(shù)資料
型號(hào): SKB02N120
廠商: INFINEON TECHNOLOGIES AG
英文描述: Fast IGBT in NPT-technology with soft, fast recovery anti-parallel EmCon diode
中文描述: 快速IGBT在不擴(kuò)散核武器條約與軟,恢復(fù)快反平行快恢復(fù)二極管技術(shù)
文件頁(yè)數(shù): 6/13頁(yè)
文件大?。?/td> 397K
代理商: SKB02N120
SKP02N60
SKB02N60
6
Jul-02
t
,
S
0A
1A
2A
3A
4A
5A
10ns
100ns
t
r
t
d(on)
t
f
t
d(off)
t
,
S
0
100
200
300
400
10ns
100ns
t
r
t
d(on)
t
f
t
d(off)
I
C
,
COLLECTOR CURRENT
Figure 9. Typical switching times as a
function of collector current
(inductive load,
T
j
= 150
°
C,
V
CE
= 400V,
V
GE
= 0/+15V,
R
G
= 118
,
Dynamic test circuit in Figure E)
R
G
,
GATE RESISTOR
Figure 10. Typical switching times as a
function of gate resistor
(inductive load,
T
j
= 150
°
C,
V
CE
= 400V,
V
GE
= 0/+15V,
I
C
= 2A,
Dynamic test circuit in Figure E)
t
,
S
0°C
50°C
100°C
150°C
10ns
100ns
t
r
t
d(on)
t
f
t
d(off)
V
G
,
G
-
E
-50°C
0°C
50°C
100°C
150°C
2.0V
2.5V
3.0V
3.5V
4.0V
4.5V
5.0V
5.5V
typ.
min.
max.
T
j
,
JUNCTION TEMPERATURE
Figure 11. Typical switching times as a
function of junction temperature
(inductive load,
V
CE
= 400V,
V
GE
= 0/+15V,
I
C
= 2A,
R
G
= 118
,
Dynamic test circuit in Figure E)
T
j
,
JUNCTION TEMPERATURE
Figure 12. Gate-emitter threshold voltage
as a function of junction temperature
(
I
C
= 0.15mA)
相關(guān)PDF資料
PDF描述
SKW07N120 Fast IGBT in NPT-technology with soft, fast recovery anti-parallel EmCon diode
SLA24C01-D The CAT24FC02 is a 2-kb Serial CMOS EEPROM internally organized as 256 words of 8 bits each
SLA24C01-S The CAT24FC02 is a 2-kb Serial CMOS EEPROM internally organized as 256 words of 8 bits each
SLA24C02-D The CAT24FC02 is a 2-kb Serial CMOS EEPROM internally organized as 256 words of 8 bits each
SLA24C02-S The CAT24FC02 is a 2-kb Serial CMOS EEPROM internally organized as 256 words of 8 bits each
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