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參數(shù)資料
| 型號： | SN54ABT8374 |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | Scan Test Devices With Octal D-Type Edge-Triggered Flip-Flops(掃描測試裝置(帶八D邊沿觸發(fā)器)) |
| 中文描述： | 掃描測試設(shè)備與八路D型邊沿觸發(fā)正反器（掃描測試裝置（帶八?邊沿觸發(fā)器）） |
| 文件頁數(shù)： | 3/19頁 |
| 文件大小： | 391K |
| 代理商： | SN54ABT8374 |
SN54ABT8374, SN74ABT8374
SCAN TEST DEVICES WITH
OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SCBS486 – JULY 1994
3–3
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Terminal Functions
TERMINAL
NAME
DESCRIPTION
CLK
Normal-function clock input. See function table for normal-mode logic.
GND
Ground
OE
Normal-function output-enable input. See function table for normal-mode logic.
TCK
Test clock. One of four terminals required by IEEE Standard 1149.1-1990. Test operations of the device are synchronous to
TCK. Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK.
TDI
Test data input. One of four terminals required by IEEE Standard 1149.1-1990. TDI is the serial input for shifting data through
the instruction register or selected data register. An internal pullup forces TDI to a high level if left unconnected.
TDO
Test data output. One of four terminals required by IEEE Standard 1149.1-1990. TDO is the serial output for shifting data
through the instruction register or selected data register.
TMS
Test mode select. One of four terminals required by IEEE Standard 1149.1-1990. TMS input directs the device through its
TAP controller states. An internal pullup forces TMS to a high level if left unconnected.
VCC
1D–8D
Supply voltage
Normal-function data inputs. See function table for normal-mode logic.
1Q–8Q
Normal-function data outputs. See function table for normal-mode logic.
P
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| SN74ABT8374 | Scan Test Devices With Octal D-Type Edge-Triggered Flip-Flops(掃描測試裝置(帶八D邊沿觸發(fā)器)) |
| SN54ABT845 | Octal Bus Interface D-Type Latches With 3-State Outputs(八總線接口D鎖存器(三態(tài)輸出)) |
| SN74ABT845 | Octal Bus Interface D-Type Latches With 3-State Outputs(八總線接口D觸發(fā)器(三態(tài)輸出)) |
| SN54ABT8543FK | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
| SN54ABT8543JT | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
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| SN54ABT841 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:10-BIT BUS-INTERFACE D-TYPE LATCHES WITH 3-STATE OUTPUTS |
| SN54ABT841FK | 制造商:TI 制造商全稱:Texas Instruments 功能描述:10-BIT BUS-INTERFACE D-TYPE LATCHES WITH 3-STATE OUTPUTS |
| SN54ABT841JT | 制造商:TI 制造商全稱:Texas Instruments 功能描述:10-BIT BUS-INTERFACE D-TYPE LATCHES WITH 3-STATE OUTPUTS |
| SN54ABT841W | 制造商:TI 制造商全稱:Texas Instruments 功能描述:10-BIT BUS-INTERFACE D-TYPE LATCHES WITH 3-STATE OUTPUTS |
| SN54ABT843 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:9-BIT BUS-INTERFACE D-TYPE LATCHES WITH 3-STATE OUTPUTS |
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