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參數資料
| 型號： | SN54ABT8543FK |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
| 中文描述： | 掃描測試設備與八進制注冊總線收發(fā)器 |
| 文件頁數： | 20/25頁 |
| 文件大?。?/td> | 357K |
| 代理商： | SN54ABT8543FK |
SN54ABT8543, SN74ABT8543
SCAN TEST DEVICES WITH
OCTAL REGISTERED BUS TRANSCEIVERS
SCBS120E – AUGUST 1991 – REVISED JULY 1996
20
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
TA = 25
°
C
TYP
SN54ABT8543
MIN
SN74ABT8543
MIN
UNIT
MIN
MAX
MAX
MAX
VIK
VCC = 4.5 V,
VCC = 4.5 V,
VCC = 5 V,
II = –18 mA
IOH = –3 mA
IOH = –3 mA
IOH = –24 mA
IOH = –32 mA
IOL = 48 mA
IOL = 64 mA
–1.2
–1.2
–1.2
V
2.5
2.5
2.5
VOH
3
3
3
V
VCC= 4 5 V
VCC = 4.5 V
2
2
2*
2
VOL
VCC= 4 5 V
VCC = 4.5 V
0.55
0.55*
0.55
V
0.55
II
CE, LE,
OE, TCK
VCC = 5.5 V, VI = VCC or GND
±
1
±
1
±
1
A
μ
A or B ports
VCC = 5.5 V, VI = VCC or GND
VCC = 5.5 V,
VCC = 5.5 V,
VCC = 5.5 V,
VCC = 5.5 V,
VCC = 0,
VCC = 0 to 2 V,
VCC = 2 V to 0,
VCC = 5.5 V,
VCC = 5.5 V,
±
100
10
±
100
10
±
100
10
IIH
IIL
IOZH
IOZL
Ioff
IOZPU
IOZPD
ICEX
IO§
TDI, TMS
VI = VCC
VI = GND
VO = 2.7 V
VO = 0.5 V
VI or VO
≤
4.5 V
VO = 0.5 V or 2.7 V
VO = 0.5 V or 2.7 V
VO = 5.5 V
VO = 2.5 V
Outputs high
μ
A
μ
A
μ
A
μ
A
μ
A
μ
A
μ
A
μ
A
mA
TDI, TMS
–40
–160
–40
–160
–40
–160
50
50
50
–50
±
100
±
50
±
50
50
–50
–50
±
100
±
50
±
50
50
±
50
±
50
50
Outputs high
–50
–100
–180
–50
–180
–50
–180
VCC= 5.5 V,
VCC = 5.5 V,
IO = 0,
VI = VCC or GND
0.9
2
2
2
ICC
A or B ports
Outputs low
30
38
38
38
mA
Outputs disabled
0.9
2
2
2
ICC
VCC = 5.5 V, One input at 3.4 V,
Other inputs at VCC or GND
VI = 2.5 V or 0.5 V
VO = 2.5 V or 0.5 V
VO = 2.5 V or 0.5 V
1.5
1.5
1.5
mA
Ci
Cio
Co
Control inputs
3
pF
A or B ports
10
pF
TDO
8
pF
*On products compliant to MIL-PRF-38535, this parameter does not apply.
All typical values are at VCC = 5 V.
The parameters IOZH and IOZL include the input leakage current.
§Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND.
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