- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄373435 > SN54ABT8543FK (Texas Instruments, Inc.) SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS PDF資料下載
參數(shù)資料
| 型號： | SN54ABT8543FK |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
| 中文描述： | 掃描測試設備與八進制注冊總線收發(fā)器 |
| 文件頁數(shù)： | 4/25頁 |
| 文件大小： | 357K |
| 代理商： | SN54ABT8543FK |
SN54ABT8543, SN74ABT8543
SCAN TEST DEVICES WITH
OCTAL REGISTERED BUS TRANSCEIVERS
SCBS120E – AUGUST 1991 – REVISED JULY 1996
4
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Terminal Functions
TERMINAL
NAME
DESCRIPTION
A1–A8
Normal-function A-bus I/O ports. See function table for normal-mode logic.
B1–B8
Normal-function B-bus I/O ports. See function table for normal-mode logic.
CEAB, CEBA
GND
Normal-function chip-enable inputs. See function table for normal-mode logic.
Ground
LEAB, LEBA
Normal-function latch-enable inputs. See function table for normal-mode logic.
OEAB, OEBA
Normal-function output-enable inputs. See function table for normal-mode logic.
TCK
Test clock. One of four terminals required by IEEE Standard 1149.1-1990. Test operations of the device are synchronous to
TCK. Data is captured on the rising edge of TCK, and outputs change on the falling edge of TCK.
TDI
Test data input. One of four terminals required by IEEE Standard 1149.1-1990. TDI is the serial input for shifting data through
the instruction register or selected data register. An internal pullup forces TDI to a high level if left unconnected.
TDO
Test data output. One of four terminals required by IEEE Standard 1149.1-1990. TDO is the serial output for shifting data
through the instruction register or selected data register.
TMS
Test mode select. One of four terminals required by IEEE Standard 1149.1-1990. TMS directs the device through its TAP
controller states. An internal pullup forces TMS to a high level if left unconnected.
VCC
Supply voltage
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| SN54ABT8543JT | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
| SN54ABT854 | 8-Bit To 9-Bit Parity Bus Transceivers(8-9奇偶總線收發(fā)器) |
| SN74ABT854 | 8-Bit To 9-Bit Parity Bus Transceivers(8-9奇偶總線收發(fā)器) |
| SN54ABT862 | 10-Bit Bus Transceivers With 3-State Outputs(10位總線收發(fā)器(三態(tài)輸出)) |
| SN74ABT862 | 10-Bit Bus Transceivers With 3-State Outputs(10位總線收發(fā)器(三態(tài)輸出)) |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SN54ABT8543JT | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
| SN54ABT861 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:10-BIT TRANSCEIVERS WITH 3-STATE OUTPUTS |
| SN54ABT861FK | 制造商:TI 制造商全稱:Texas Instruments 功能描述:10-BIT TRANSCEIVERS WITH 3-STATE OUTPUTS |
| SN54ABT861JT | 制造商:TI 制造商全稱:Texas Instruments 功能描述:10-BIT TRANSCEIVERS WITH 3-STATE OUTPUTS |
| SN54ABT863 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:9-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS |
發(fā)布緊急采購，3分鐘左右您將得到回復。