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| 型號： | SN54ABT8543JT |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
| 中文描述： | 掃描測試設(shè)備與八進制注冊總線收發(fā)器 |
| 文件頁數(shù)： | 18/25頁 |
| 文件大?。?/td> | 357K |
| 代理商： | SN54ABT8543JT |
SN54ABT8543, SN74ABT8543
SCAN TEST DEVICES WITH
OCTAL REGISTERED BUS TRANSCEIVERS
SCBS120E – AUGUST 1991 – REVISED JULY 1996
18
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
E
E
T
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
R
S
S
C
S
U
S
C
S
U
S
S
T
TCK
TMS
TDI
TDO
TAP
Controller
State
3-State (TDO) or Don’t Care (TDI)
Figure 12. Timing Example
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
CC
Input voltage range, V
I
: except I/O ports (see Note 1)
I/O ports (see Note 1)
Voltage range applied to any output in the high state or power-off state, V
O
Current into any output in the low state, I
O
: SN54ABT8543
–0.5 V to 7 V
–0.5 V to 7 V
–0.5 V to 5.5 V
–0.5 V to 5.5 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
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. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . .
96 mA
128 mA
–18 mA
–50 mA
0.7 W
1.7 W
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
SN74ABT8543
Input clamp current, I
IK
(V
I
< 0)
Output clamp current, I
OK
(V
O
< 0)
Maximum power dissipation at T
A
= 55
°
C (in still air) (see Note 2):DL package
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
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. . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . .
DW package
Storage temperature range, T
stg
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES:
1. The input and output negative-voltage ratings can be exceeded if the input and output clamp-current ratings are observed.
2. The maximum package power dissipation is calculated using a junction temperature of 150
°
C and a board trace length of 750 mils.
For more information, refer to the Package Thermal Considerationsapplication note in the ABT Advanced BiCMOS Technology Data
Book literature number SCBD002.
–65
°
C to 150
°
C
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