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參數(shù)資料
| 型號： | SN54ABT8543JT |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
| 中文描述： | 掃描測試設(shè)備與八進制注冊總線收發(fā)器 |
| 文件頁數(shù)： | 3/25頁 |
| 文件大?。?/td> | 357K |
| 代理商： | SN54ABT8543JT |
SN54ABT8543, SN74ABT8543
SCAN TEST DEVICES WITH
OCTAL REGISTERED BUS TRANSCEIVERS
SCBS120E – AUGUST 1991 – REVISED JULY 1996
3
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
functional block diagram
Boundary-Control
Register
Bypass Register
Boundary-Scan Register
Instruction Register
TDI
TMS
TCK
TDO
TAP
Controller
VCC
VCC
1D
C1
1D
C1
One of Eight Channels
OEBA
CEBA
LEBA
OEAB
CEAB
LEAB
A1
B1
25
13
26
27
28
3
2
1
4
16
14
15
Pin numbers shown are for the DL, DW, and JT packages.
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