- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄373435 > SN54ABTH182504A (Texas Instruments, Inc.) Scan Test Devices With 20 Bit Universal Bus Transceivers(掃描檢測裝置，帶20位通用總線收發(fā)器) PDF資料下載
參數(shù)資料
| 型號： | SN54ABTH182504A |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | Scan Test Devices With 20 Bit Universal Bus Transceivers(掃描檢測裝置，帶20位通用總線收發(fā)器) |
| 中文描述： | 掃描測試設備與20位通用總線收發(fā)器（掃描檢測裝置，帶20位通用總線收發(fā)器） |
| 文件頁數(shù)： | 10/35頁 |
| 文件大?。?/td> | 812K |
| 代理商： | SN54ABTH182504A |
第1頁第2頁第3頁第4頁第5頁第6頁第7頁第8頁第9頁當前第10頁第11頁第12頁第13頁第14頁第15頁第16頁第17頁第18頁第19頁第20頁第21頁第22頁第23頁第24頁第25頁第26頁第27頁第28頁第29頁第30頁第31頁第32頁第33頁第34頁第35頁
SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A
SCAN TEST DEVICES WITH
20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS165C – AUGUST 1993 – REVISED JULY 1996
10
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
data register description
boundary-scan register
The boundary-scan register (BSR) is 48 bits long. It contains one boundary-scan cell (BSC) for each
normal-function input pin and one BSC for each normal-function I/O pin (one single cell for both input data and
output data). The BSR is used 1) to store test data that is to be applied externally to the device output pins,
and/or 2) to capture data that appears internally at the outputs of the normal on-chip logic and/or externally at
the device input pins.
The source of data to be captured into the BSR during Capture-DR is determined by the current instruction. The
contents of the BSR can change during Run-Test/Idle as determined by the current instruction. At power up or
in Test-Logic-Reset, BSCs 47–46 are reset to logic 1, ensuring that these cells, which control A-port and B-port
outputs, are set to benign values (i.e., if test mode were invoked, the outputs would be at high-impedance state).
Reset values of other BSCs should be considered indeterminate.
The BSR order of scan is from TDI through bits 47–0 to TDO. Table 1 shows the BSR bits and their associated
device pin signals.
Table 1. Boundary-Scan Register Configuration
BSR BIT
NUMBER
DEVICE
SIGNAL
BSR BIT
NUMBER
DEVICE
SIGNAL
BSR BIT
NUMBER
DEVICE
SIGNAL
47
OEAB
39
A20-I/O
19
B20-I/O
46
OEBA
38
A19-I/O
18
B19-I/O
45
CLKAB
37
A18-I/O
17
B18-I/O
44
CLKBA
36
A17-I/O
16
B17-I/O
43
CLKENAB
35
A16-I/O
15
B16-I/O
42
CLKENBA
34
A15-I/O
14
B15-I/O
41
LEAB
33
A14-I/O
13
B14-I/O
40
LEBA
32
A13-I/O
12
B13-I/O
––
––
31
A12-I/O
11
B12-I/O
––
––
30
A11-I/O
10
B11-I/O
––
––
29
A10-I/O
9
B10-I/O
––
––
28
A9-I/O
8
B9-I/O
––
––
27
A8-I/O
7
B8-I/O
––
––
26
A7-I/O
6
B7-I/O
––
––
25
A6-I/O
5
B6-I/O
––
––
24
A5-I/O
4
B5-I/O
––
––
23
A4-I/O
3
B4-I/O
––
––
22
A3-I/O
2
B3-I/O
––
––
21
A2-I/O
1
B2-I/O
––
––
20
A1-I/O
0
B1-I/O
相關PDF資料 |
PDF描述 |
|---|---|
| SN54ABTH18504A | Scan Test Devices With 20 Bit Universal Bus Transceivers(掃描檢測裝置，帶20位通用總線收發(fā)器) |
| SN54ABTH182646AHV | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS |
| SN54ABTH18646AHV | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS |
| SN54ABTH182646A | Scan Test Devices With 18 Bit Universal Bus Transceivers( 掃描檢測裝置，帶18位收發(fā)器和寄存器) |
| SN54ABTH1826520A | Scan Test Devices With 18 Bit Universal Bus Transceivers and Registers( 掃描檢測裝置，帶18位總線收發(fā)器和寄存器) |
相關代理商/技術參數(shù) |
參數(shù)描述 |
|---|---|
| SN54ABTH182504AHV | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
| SN54ABTH182646A | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS |
| SN54ABTH182646AHV | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS |
| SN54ABTH182652A | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS |
| SN54ABTH182652AHV | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS |
發(fā)布緊急采購，3分鐘左右您將得到回復。