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參數(shù)資料
| 型號： | SN54ABTH182504A |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | Scan Test Devices With 20 Bit Universal Bus Transceivers(掃描檢測裝置，帶20位通用總線收發(fā)器) |
| 中文描述： | 掃描測試設(shè)備與20位通用總線收發(fā)器（掃描檢測裝置，帶20位通用總線收發(fā)器） |
| 文件頁數(shù)： | 18/35頁 |
| 文件大?。?/td> | 812K |
| 代理商： | SN54ABTH182504A |
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SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A
SCAN TEST DEVICES WITH
20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS165C – AUGUST 1993 – REVISED JULY 1996
18
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
parallel-signature analysis (PSA)
Data appearing at the selected device input-mode I/O pins is compressed into a 40-bit parallel signature in the
shift-register elements of the selected BSCs on each rising edge of TCK. Data in the shadow latches of the
selected output-mode BSCs remains constant and is applied to the associated device I/O pins. Figures 7 and 8
show the 40-bit linear-feedback shift-register algorithms through which the signature is generated. An initial
seed value should be scanned into the BSR before performing this operation.
B8-I/O
B7-I/O
B6-I/O
B5-I/O
B4-I/O
B3-I/O
B2-I/O
B1-I/O
B10-I/O
A7-I/O
A6-I/O
A5-I/O
A4-I/O
A3-I/O
A2-I/O
A1-I/O
A8-I/O
A10-I/O
A17-I/O
A16-I/O
A15-I/O
A14-I/O
A13-I/O
A12-I/O
A11-I/O
A18-I/O
A20-I/O
B18-I/O
B17-I/O
B16-I/O
B15-I/O
B14-I/O
B13-I/O
B12-I/O
B11-I/O
B20-I/O
B9-I/O
A9-I/O
A19-I/O
B19-I/O
=
=
Figure 7. 40-Bit PSA Configuration (OEAB = 0, OEBA = 1)
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| SN54ABTH18504A | Scan Test Devices With 20 Bit Universal Bus Transceivers(掃描檢測裝置，帶20位通用總線收發(fā)器) |
| SN54ABTH182646AHV | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS |
| SN54ABTH18646AHV | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS |
| SN54ABTH182646A | Scan Test Devices With 18 Bit Universal Bus Transceivers( 掃描檢測裝置，帶18位收發(fā)器和寄存器) |
| SN54ABTH1826520A | Scan Test Devices With 18 Bit Universal Bus Transceivers and Registers( 掃描檢測裝置，帶18位總線收發(fā)器和寄存器) |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SN54ABTH182504AHV | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
| SN54ABTH182646A | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS |
| SN54ABTH182646AHV | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS |
| SN54ABTH182652A | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS |
| SN54ABTH182652AHV | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS |
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