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參數(shù)資料
| 型號(hào)： | SN54ABTH182504A |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | Scan Test Devices With 20 Bit Universal Bus Transceivers(掃描檢測(cè)裝置，帶20位通用總線收發(fā)器) |
| 中文描述： | 掃描測(cè)試設(shè)備與20位通用總線收發(fā)器（掃描檢測(cè)裝置，帶20位通用總線收發(fā)器） |
| 文件頁數(shù)： | 3/35頁 |
| 文件大?。?/td> | 812K |
| 代理商： | SN54ABTH182504A |
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SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A
SCAN TEST DEVICES WITH
20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS165C – AUGUST 1993 – REVISED JULY 1996
3
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
description (continued)
Four dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test data
output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing
functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation
(PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
Improved scan efficiency is accomplished through the adoption of a one boundary-scan cell (BSC) per I/O pin
architecture. This architecture is implemented in such a way as to capture the most pertinent test data. A
PSA/COUNT instruction also is included to ease the testing of memories and other circuits where a binary count
addressing scheme is useful.
Active bus-hold circuitry holds unused or floating data inputs at a valid logic level.
The B-port outputs of ’ABTH182504A, which are designed to source or sink up to 12 mA, include 25-
series
resistors to reduce overshoot and undershoot.
The SN54ABTH18504A and SN54ABTH182504A are characterized for operation over the full military
temperature range of –55
°
C to 125
°
C. The SN74ABTH18504A and SN74ABTH182504A are characterized for
operation from –40
°
C to 85
°
C.
FUNCTION TABLE
(normal mode, each register)
INPUTS
CLKENAB
OUTPUT
B
B0
L
OEAB
LEAB
CLKAB
A
L
L
L
L
↑
↑
X
X
L
L
L
L
L
L
L
H
H
L
L
H
X
B0
L
L
H
X
X
L
L
H
X
X
H
H
H
X
X
X
X
Z
A-to-B data flow is shown. B-to-A data flow is similar but uses OEBA,
LEBA, CLKENBA, and CLKBA.
Output level before the indicated steady-state input conditions were
established
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| SN54ABTH18504A | Scan Test Devices With 20 Bit Universal Bus Transceivers(掃描檢測(cè)裝置，帶20位通用總線收發(fā)器) |
| SN54ABTH182646AHV | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS |
| SN54ABTH18646AHV | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS |
| SN54ABTH182646A | Scan Test Devices With 18 Bit Universal Bus Transceivers( 掃描檢測(cè)裝置，帶18位收發(fā)器和寄存器) |
| SN54ABTH1826520A | Scan Test Devices With 18 Bit Universal Bus Transceivers and Registers( 掃描檢測(cè)裝置，帶18位總線收發(fā)器和寄存器) |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SN54ABTH182504AHV | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
| SN54ABTH182646A | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS |
| SN54ABTH182646AHV | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS |
| SN54ABTH182652A | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS |
| SN54ABTH182652AHV | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS |
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