參數(shù)資料
型號(hào)： SN74ABTH1826520A
廠商： Texas Instruments, Inc.
英文描述： Scan Test Devices With 18 Bit Universal Bus Transceivers And Registers( 掃描檢測(cè)裝置帶18位總線收發(fā)器和寄存器)
中文描述： 掃描測(cè)試設(shè)備與18位通用總線收發(fā)器和寄存器（掃描檢測(cè)裝置帶18位總線收發(fā)器和寄存器）
文件頁數(shù)： 6/36頁
文件大?。?/td> 848K
代理商： SN74ABTH1826520A
SN54ABTH18652A, SN54ABTH182652A, SN74ABTH18652A, SN74ABTH182652A
SCAN TEST DEVICES WITH
18-BIT BUS TRANSCEIVERS AND REGISTERS
SCBS167D – AUGUST 1993 – REVISED JULY 1996
6
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Terminal Functions
TERMINAL NAME
DESCRIPTION
1A1–1A9,
2A1–2A9
Normal-function A-bus I/O ports. See function table for normal-mode logic.
1B1–1B9,
2B1–2B9
Normal-function B-bus I/O ports. See function table for normal-mode logic.
1CLKAB, 1CLKBA,
2CLKAB, 2CLKBA
Normal-function clock inputs. See function table for normal-mode logic.
GND
Ground
1OEAB, 2OEAB
Normal-function active-high output enables. See function table for normal-mode logic. An internal pulldown at each
terminal forces the terminal to a high level if left unconnected.
1OEBA, 2OEBA
Normal-function active-low output enables. See function table for normal-mode logic. An internal pullup at each terminal
forces the terminal to a high level if left unconnected.
1SAB, 1SBA,
2SAB, 2SBA
Normal-function select controls. See function table for normal-mode logic.
TCK
Test clock. One of four terminals required by IEEE Standard 1149.1-1990. Test operations of the device are synchronous
to TCK. Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK.
TDI
Test data input. One of four terminals required by IEEE Standard 1149.1-1990. TDI is the serial input for shifting data
through the instruction register or selected data register. An internal pullup forces TDI to a high level if left unconnected.
TDO
Test data output. One of four terminals required by IEEE Standard 1149.1-1990. TDO is the serial output for shifting data
through the instruction register or selected data register.
TMS
Test mode select. One of four terminals required by IEEE Standard 1149.1-1990. TMS directs the device through its TAP
controller states. An internal pullup forces TMS to a high level if left unconnected.
VCC
Supply voltage
相關(guān)PDF資料
PDF描述
SN54ABTH18652A Scan Test Devices With 18 Bit Universal Bus Transceivers and Registers( 掃描檢測(cè)裝置，帶18位總線收發(fā)器和寄存器)
SN54ABTH245FK OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS
SN74ABTH245DB OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS
SN74ABTH245DGV OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS
SN74ABTH245PW OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
SN74ABTH182652APM 功能描述:特定功能邏輯 Device w/18-Bit Trnscvr & Register RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74ABTH18502APM 功能描述:特定功能邏輯 Device w/18-Bit Univ Bus Transceiver RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74ABTH18502APMG4 功能描述:特定功能邏輯 Device w/18-Bit Univ Bus Transceiver RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74ABTH18502APMR 功能描述:特定功能邏輯 Device w/18-Bit Univ Bus Transceiver RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74ABTH18504APM 功能描述:特定功能邏輯 Device w/20-Bit Univ Bus Transceiver RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
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