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參數(shù)資料
| 型號： | SP526CF |
| 英文描述： | WAN Multi-Mode Serial Transceiver |
| 中文描述： | 萬多模式串行收發(fā)器 |
| 文件頁數(shù)： | 19/23頁 |
| 文件大小： | 141K |
| 代理商： | SP526CF |
19
Rev: B Date:7/7/04
SP526 Multi–Mode Serial Transceiver
Copyright 2004 Sipex Corporation
Phase 4
— V
transfer — The fourth phase of the clock
connects the negative terminal of C
to ground,
and transfers the generated l0V across C
to C
4
,
the V
storage capacitor. Again, simultaneously
with this, the positive side of capacitor C
is
switched to +5V and the negative side is con-
nected to ground, and the cycle begins again.
Since both V
+
and V
–
are separately generated
from V
; in a no–load condition V
+
and V
–
will
be symmetrical. Older charge pump approaches
that generate V
–
from V
+
will show a decrease in
the magnitude of V
–
compared to V
+
due to the
inherent inefficiencies in the design.
The clock rate for the charge pump typically
operates at 15kHz. The external capacitors can
be as low as 1.0
μ
F with a 16V breakdown
voltage rating.
ESD Tolerance
The
SP526
device incorporates ruggedized
ESD cells on all driver output and receiver input
pins. The ESD structure is improved over our
previous family for more rugged applications
and environments sensitive to electro-static
discharges and associated transients. The
improved ESD tolerance is at least
±
15kV
without damage nor latch-up.
There are different methods of ESD testing
applied:
a) MIL-STD-883, Method 3015.7
b) IEC1000-4-2 Air-Discharge
c) IEC1000-4-2 Direct Contact
The Human Body Model has been the generally
accepted ESD testing method for semiconductors.
This method is also specified in MIL-STD-883,
Method 3015.7 for ESD testing. The premise of
this ESD test is to simulate the human body’s
potential to store electro-static energy and
discharge it to an integrated circuit. The
simulation is performed by using a test model as
shown in
Figure 35.
This method will test the
IC’s capability to withstand an ESD transient
during normal handling such as in manufacturing
areas where the ICs tend to be handled frequently.
The IEC-1000-4-2, formerly IEC801-2, is
generally used for testing ESD on equipment and
systems. For system manufacturers, they must
guarantee a certain amount of ESD protection
since the system itself is exposed to the outside
environment and human presence. The premise
with IEC1000-4-2 is that the system is required
to withstand an amount of static electricity when
ESD is applied to points and surfaces of the
equipment that are accessible to personnel during
normal usage. The transceiver IC receives most
R
C
SW
DC Power
Source
C
S
R
S
SW2
Device
Under
Test
Figure 35. ESD Test Circuit for Human Body Model
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SP526CF-L | 功能描述:外圍驅(qū)動器與原件 - PCI WAN Multi-Mode Serial RoHS:否 制造商:PLX Technology 工作電源電壓: 最大工作溫度: 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:FCBGA-1156 封裝:Tray |
| SP527A | 制造商:Black Box Corporation 功能描述:DDS SURGE PROTECTOR RJ-45 |
| SP527A-W1 | 制造商:Black Box Corporation 功能描述:1 YEAR WARRANTY FOR SP527A |
| SP527A-W3 | 制造商:Black Box Corporation 功能描述:3 YEAR WARRANTY FOR SP527A |
| SP529A | 制造商:Black Box Corporation 功能描述:GIG IN-LINE SURGE PROTECTOR |
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