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參數(shù)資料
| 型號： | SP526CF |
| 英文描述： | WAN Multi-Mode Serial Transceiver |
| 中文描述： | 萬多模式串行收發(fā)器 |
| 文件頁數(shù)： | 21/23頁 |
| 文件大小： | 141K |
| 代理商： | SP526CF |
21
Rev: B Date:7/7/04
SP526 Multi–Mode Serial Transceiver
Copyright 2004 Sipex Corporation
potential to the system and humidity will tend to
change the discharge current. For example, the
rise time of the discharge current varies with the
approach speed.
The Contact Discharge Method applies the ESD
current directly to the EUT. This method was
devised to reduce the unpredictability of the
ESD arc. The discharge current rise time is
constant since the energy is directly transferred
without the air-gap arc. In situations such as
hand held systems, the ESD charge can be directly
discharged to the equipment from a person already
holding the equipment. The current is transferred
on to the keypad or the serial port of the equipment
directly and then travels through the PCB and
finally to the IC.
The circuit models in
Figures 35
and
36
represent
the typical ESD testing circuits used for all three
methods. The C
S
is initially charged with the DC
power supply when the first switch (SW1) is on.
Now that the capacitor is charged, the second
switch (SW2) is on while SW1 switches off. The
voltage stored in the capacitor is then applied
through R
S
, the current limiting resistor, onto the
device under test (DUT). In ESD tests, the SW2
switch is pulsed so that the device under test
receives a duration of voltage.
For the Human Body Model, the current limiting
resistor (R
) and the source capacitor (C
) are
1.5k
an 100pF, respectively. For IEC-1000-4-
2, the current limiting resistor (R
) and the source
capacitor (C
S
) are 330
an 150pF, respectively.
The higher C
value and lower R
value in the
IEC1000-4-2 model are more stringent than the
Human Body Model. The larger storage capacitor
injects a higher voltage to the test point when
SW2 is switched on. The lower current limiting
resistor increases the current charge onto the test
point.
NET1/NET2 European Compliancy
As with all of
Sipex's
previous multi-protocol
serial transceiver ICs, the drivers and receivers
have been designed to meet all the requirements
to NET1/NET2. The
SP526
is also tested and
adheres to all the NET1/2 physical layer testing
and the ITU Series V specifications. Please note
that although the
SP526
, as with its predecessors,
adheres to NET1/2 testing, any complex or
unusual configuration should be double-checked
to ensure NET compliance. Consult the factory
for details.
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相關代理商/技術參數(shù) |
參數(shù)描述 |
|---|---|
| SP526CF-L | 功能描述:外圍驅動器與原件 - PCI WAN Multi-Mode Serial RoHS:否 制造商:PLX Technology 工作電源電壓: 最大工作溫度: 安裝風格:SMD/SMT 封裝 / 箱體:FCBGA-1156 封裝:Tray |
| SP527A | 制造商:Black Box Corporation 功能描述:DDS SURGE PROTECTOR RJ-45 |
| SP527A-W1 | 制造商:Black Box Corporation 功能描述:1 YEAR WARRANTY FOR SP527A |
| SP527A-W3 | 制造商:Black Box Corporation 功能描述:3 YEAR WARRANTY FOR SP527A |
| SP529A | 制造商:Black Box Corporation 功能描述:GIG IN-LINE SURGE PROTECTOR |
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