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μ
PD75312(A), 75316(A)
16
3.5
NOTES ON USING THE P00/INT4, AND RESET PINS
In addition to the functions described in Sections 3.1 and 3.2, an exclusive function for setting the test mode,
in which the internal fuctions of the
μ
PD75316(A) are tested, is provided to the P00/INT4 and RESET pins.
If a voltage exceeding V
DD
is applied to either of these pins, the
μ
PD75316(A) is put into test mode. Therefore,
even when the
μ
PD75316(A) is in normal operation, if noise exceeding the V
DD
is input into any of these pins,
the
μ
PD75316(A) will enter the test mode, and this will cause problems for normal operation.
As an example, if the wiring to the P00/INT4 pin or the RESET pin is long, stray noise may be picked up and
the above montioned problem may occur.
Therefore, all wiring to these pins must be made short enough to not pick up stray noise. If noise cannot
be avoided, suppress the noise using a capacitor or diode as shown in the figure below.
Connect a diode having a low V
F
across
P00/INT4 and RESET, and V
DD
.
Connect a capacitor across P00/INT4 and
RESET, and V
DD
.
4.
MEMORY CONFIGURATION
Program memory (ROM) ...16256
×
8 bits (0000H-3F7FH):
μ
PD75316(A)
...12160
×
8 bits (0000H-2F7FH):
μ
PD75312(A)
0000H, 0001H :
Vector table to which address from which program is started is written after
reset
0002H-000BH: Vector table to which address from which program is started is written after
interrupt
0020H-007FH: Table area referenced by GETI instruction
Data memory
Data area .... 512
×
4 bits (000H–1FFH)
Peripheral hardware area .... 128
×
4 bits (F80H–FFFH)
V
DD
V
DD
P00/INT4, RESET
V
DD
V
DD
P00/INT4, RESET
Low V
F
diode