Spartan-IIE 1.8V FPGA Family: DC and Switching Characteristics
DS077-3 (v2.0) November 18, 2002
Product Specification
www.xilinx.com
1-800-255-7778
11
R
Calculation of T
IOOP
as a Function of
Capacitance
T
IOOP
is the propagation delay from the O Input of the IOB
to the pad. The values for T
IOOP
are based on the standard
capacitive load (C
SL
) for each I/O standard as listed in the
table
Constants for Calculating T
IOOP
, below.
For other capacitive loads, use the formulas below to calcu-
late an adjusted propagation delay, T
IOOP1
.
T
IOOP1
= T
IOOP
+ Adj + (C
LOAD
–
C
SL
) * F
L
Where:
Adj
is selected from
IOB Output Delay
Adjustments for Different Standards(1)
,
page 10
, according to the I/O standard used
C
LOAD
is the capacitive load for the design
F
L
is the capacitance scaling factor
Delay Measurement Methodology
Standard
V
L(1)
0
V
H(1)
3
Meas.
Point
V
REF
Typ
(2)
LVTTL
1.4
-
LVCMOS2
0
2.5
1.125
-
PCI33_3
Per PCI Spec
-
PCI66_3
Per PCI Spec
-
GTL
V
REF
–
0.2
V
REF
–
0.2
V
REF
–
0.5
V
REF
+ 0.2
V
REF
+ 0.2
V
REF
+ 0.5
V
REF
+ 0.5
V
REF
+ 0.5
V
REF
+ 1.0
V
REF
V
REF
V
REF
V
REF
V
REF
V
REF
V
REF
V
REF
V
REF
0.80
GTL+
1.0
HSTL Class I
0.75
HSTL Class III V
REF
–
0.5
HSTL Class IV V
REF
–
0.5
SSTL3 I and II V
REF
–
1.0
SSTL2 I and II V
REF
–
0.75 V
REF
+ 0.75
CTT
V
REF
–
0.2
AGP
V
REF
–
(0.2xV
CCO
)
LVDS
1.2
–
0.125 1.2 + 0.125
0.90
0.90
1.5
1.25
V
REF
+ 0.2
V
REF
+
(0.2xV
CCO
)
1.5
Per AGP
Spec
1.2
LVPECL
1.6
–
0.3
1.6 + 0.3
1.6
Notes:
1.
2.
Input waveform switches between V
L
and V
H
.
Measurements are made at V
Typ, Maximum, and
Minimum. Worst-case values are reported.
I/O parameter measurements are made with the capacitance
values shown in the following table,
Constants for
Calculating T
XAPP179 for
appropriate terminations.
I/O standard measurements are reflected in the IBIS model
information except where the IBIS format precludes it.
3.
4.
Constants for Calculating T
IOOP
Standard
C
SL(1)
(pF)
F
L
(ns/pF)
LVTTL Fast Slew Rate, 2 mA drive
35
0.41
LVTTL Fast Slew Rate, 4 mA drive
35
0.20
LVTTL Fast Slew Rate, 6 mA drive
35
0.13
LVTTL Fast Slew Rate, 8 mA drive
35
0.079
LVTTL Fast Slew Rate, 12 mA drive
35
0.044
LVTTL Fast Slew Rate, 16 mA drive
35
0.043
LVTTL Fast Slew Rate, 24 mA drive
35
0.033
LVTTL Slow Slew Rate, 2 mA drive
35
0.41
LVTTL Slow Slew Rate, 4 mA drive
35
0.20
LVTTL Slow Slew Rate, 6 mA drive
35
0.100
LVTTL Slow Slew Rate, 8 mA drive
35
0.086
LVTTL Slow Slew Rate, 12 mA drive
35
0.058
LVTTL Slow Slew Rate, 16 mA drive
35
0.050
LVTTL Slow Slew Rate, 24 mA drive
35
0.048
LVCMOS2
35
0.041
LVCMOS18
35
0.050
PCI 33 MHz 3.3V
10
0.050
PCI 66 MHz 3.3V
10
0.033
GTL
0
0.014
GTL+
0
0.017
HSTL Class I
20
0.022
HSTL Class III
20
0.016
HSTL Class IV
20
0.014
SSTL2 Class I
30
0.028
SSTL2 Class II
30
0.016
SSTL3 Class I
30
0.029
SSTL3 Class II
30
0.016
CTT
20
0.035
AGP
10
0.037
Notes:
1.
I/O parameter measurements are made with the capacitance
values shown above. Refer to Application Note
XAPP179
for
appropriate terminations.
I/O standard measurements are reflected in the IBIS model
information except where the IBIS format precludes it.
2.