參數(shù)資料
型號: 9S12D32DGV1
英文描述: 9S12DGDJ64DGV1 Device Guide. also covers 9S12D64. 9S12A64. 9S12D32. and 9S12A32 devices
中文描述: 9S12DGDJ64DGV1設備指南。也包括9S12D64。 9S12A64。 9S12D32。和9S12A32設備
文件頁數(shù): 101/126頁
文件大?。?/td> 1809K
代理商: 9S12D32DGV1
MC9S12DJ64 Device User Guide — V01.17
101
A.3.2 NVM Reliability
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures.
The failure rates for data retention and program/erase cycling are specified at the operating conditions
noted.
The program/erase cycle count on the sector is incremented every time a sector or mass erase event is
executed.
Table A-12 NVM Reliability Characteristics
Conditions are shown in
Table A-4
unless otherwise noted
Num C
Rating
Symbol
Min
Typ
Max
Unit
1
C
Data Retention at an average junction temperature of
T
Javg
= 70
°
C
t
NVMRET
15
Years
2
C Flash number of Program/Erase cycles
n
FLPE
10,000
Cycles
3
C
EEPROM number of Program/Erase cycles
(–40
°
C
T
J
0
°
C)
n
EEPE
10,000
Cycles
4
C
EEPROM number of Program/Erase cycles
(0
°
C < T
J
140
°
C)
n
EEPE
100,000
Cycles
相關PDF資料
PDF描述
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相關代理商/技術參數(shù)
參數(shù)描述
9S12DJ64DGV1 制造商:未知廠家 制造商全稱:未知廠家 功能描述:9S12DJ64DG Device Guide. also covers 9S12D64. 9S12A64. 9S12D32 and 9S12A32 devices
9S12DP256BDGV1 制造商:FREESCALE 制造商全稱:Freescale Semiconductor, Inc 功能描述:Automotive applications
9S12DP256BDGV2 制造商:未知廠家 制造商全稱:未知廠家 功能描述:9S12Dx256B Device Guide. also covers C derivatives and 9S12Ax256 devices
9S12DP512DGV1 制造商:未知廠家 制造商全稱:未知廠家 功能描述:9S12Dx512 Device Guide
9S12DT128BDGV1 制造商:未知廠家 制造商全稱:未知廠家 功能描述:9S12DT128B Device Guide