參數(shù)資料
型號: AD5170BRMZ50-RL7
廠商: Analog Devices Inc
文件頁數(shù): 6/24頁
文件大?。?/td> 0K
描述: IC DGTL POT 256POS 50K 10MSOP
標(biāo)準(zhǔn)包裝: 1,000
接片: 256
電阻(歐姆): 50k
電路數(shù): 1
溫度系數(shù): 標(biāo)準(zhǔn)值 35 ppm/°C
存儲器類型: 易失
接口: I²C,2 線串口
電源電壓: 2.7 V ~ 5.5 V
工作溫度: -40°C ~ 125°C
安裝類型: 表面貼裝
封裝/外殼: 10-TFSOP,10-MSOP(0.118",3.00mm 寬)
供應(yīng)商設(shè)備封裝: 10-MSOP
包裝: 帶卷 (TR)
AD5170
Rev. G | Page 14 of 24
TEST CIRCUITS
Figure 27 to Figure 32 illustrate the test circuits that define the test conditions used in the product specification tables.
0
41
04
-0
26
VMS
A
W
B
DUT
V+
V+ = VDD
1LSB = V+/2N
Figure 27. Test Circuit for Potentiometer Divider Nonlinearity Error (INL, DNL)
04
10
4-
0
27
NO CONNECT
IW
VMS
A W
B
DUT
Figure 28. Test Circuit for Resistor Position Nonlinearity Error
(Rheostat Operation; R-INL, R-DNL)
04
10
4-
02
8
VMS2
VMS1
VW
A
W
B
DUT
IW = VDD/RNOMINAL
RW = [VMS1 – VMS2]/IW
Figure 29. Test Circuit for Wiper Resistance
04
10
4-
0
29
VMS%
DUT
(
)
A
W
B
V+
VDD%
VMS
VDD
VA
VMS
V+ = VDD ± 10%
PSRR (dB) = 20 LOG
PSS (%/%) =
Figure 30. Test Circuit for Power Supply Sensitivity (PSS, PSRR)
04
10
4-
03
0
+5V
–5V
W
A
2.5V
B
VOUT
OFFSET
GND
DUT
VIN
AD8610
Figure 31. Test Circuit for Gain vs. Frequency
W
B
VCM
ICM
A
NC
GND
NC
VDD
DUT
NC = NO CONNECT
041
04
-03
2
Figure 32. Test Circuit for Common-Mode Leakage Current
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