VDD = 2.5 V to 5.5 V; R<" />
參數(shù)資料
型號(hào): AD5313ARUZ
廠商: Analog Devices Inc
文件頁(yè)數(shù): 25/28頁(yè)
文件大?。?/td> 0K
描述: IC DAC 10BIT DUAL R-R 16-TSSOP
產(chǎn)品培訓(xùn)模塊: Data Converter Fundamentals
DAC Architectures
標(biāo)準(zhǔn)包裝: 96
設(shè)置時(shí)間: 7µs
位數(shù): 10
數(shù)據(jù)接口: 串行
轉(zhuǎn)換器數(shù)目: 2
電壓電源: 單電源
功率耗散(最大): 2.5mW
工作溫度: -40°C ~ 105°C
安裝類型: 表面貼裝
封裝/外殼: 16-TSSOP(0.173",4.40mm 寬)
供應(yīng)商設(shè)備封裝: 16-TSSOP
包裝: 管件
輸出數(shù)目和類型: 2 電壓,單極;2 電壓,雙極
采樣率(每秒): 143k
產(chǎn)品目錄頁(yè)面: 782 (CN2011-ZH PDF)
AD5303/AD5313/AD5323
Rev. B | Page 6 of 28
AC CHARACTERISTICS1
VDD = 2.5 V to 5.5 V; RL = 2 kΩ to GND; CL = 200 pF to GND; all specifications TMIN to TMAX, unless otherwise noted.
Table 2.
A, B Version3
Parameter2
Min
Typ
Max
Unit
Conditions/Comments
Output Voltage Settling Time
VREF = VDD = 5 V
AD5303
6
8
μs
scale to scale change (0x40 to 0xc0)
AD5313
7
9
μs
scale to scale change (0x100 to 0x300)
AD5323
8
10
μs
scale to scale change (0x400 to 0xc00)
Slew Rate
0.7
V/μs
Major-Code Transition Glitch Energy
12
nV-s
1 LSB change around major carry
(011 . . . 11 to 100 . . . 00)
Digital Feedthrough
0.10
nV-s
Analog Crosstalk
0.01
nV-s
DAC-to-DAC Crosstalk
0.01
nV-s
Multiplying Bandwidth
200
kHz
VREF = 2 V ± 0.1 V p-p, unbuffered mode
Total Harmonic Distortion
70
dB
VREF = 2.5 V ± 0.1 V p-p, frequency = 10 kHz
1 Guaranteed by design and characterization, not production tested.
2 See the Terminology section.
3 Temperature range for Version A and Version B: 40°C to +105°C.
TIMING CHARACTERISTICS
VDD = 2.5 V to 5.5 V; all specifications TMIN to TMAX, unless otherwise noted.
Table 3.
Limit at TMIN, TMAX
Parameter1, 2, 3
(A, B Version)
Unit
Conditions/Comments
t1
33
ns min
SCLK cycle time
t2
13
ns min
SCLK high time
t3
13
ns min
SCLK low time
t4
0
ns min
SYNC to SCLK rising edge setup time
t5
5
ns min
Data setup time
t6
4.5
ns min
Data hold time
t7
0
ns min
SCLK falling edge to SYNC rising edge
t8
100
ns min
Minimum SYNC high time
t9
20
ns min
LDAC pulse width
t10
20
ns min
SCLK falling edge to LDAC rising edge
t11
20
ns min
CLR pulse width
5
ns min
SCLK falling edge to SDO invalid
20
ns max
SCLK falling edge to SDO valid
0
ns min
SCLK falling edge to SYNC rising edge
10
ns min
SYNC rising edge to SCLK rising edge
1 Guaranteed by design and characterization, not production tested.
2 All input signals are specified with tr = tf = 5 ns (10% to 90% of VDD) and timed from a voltage level of (VIL + VIH)/2.
4 These are measured with the load circuit of Figure 4.
5 Daisy-chain mode only (see Figure 47).
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