參數(shù)資料
型號(hào)： AD9279-80KITZ
廠商： Analog Devices Inc
文件頁(yè)數(shù)： 26/44頁(yè)
文件大?。?/td> 0K
描述： KIT EVALUATION FOR AD9279
標(biāo)準(zhǔn)包裝： 1
ADC 的數(shù)量： 8
位數(shù)： 12
采樣率（每秒）： 80M
數(shù)據(jù)接口： 串行
工作溫度： -40°C ~ 85°C
已用 IC / 零件： AD9279
已供物品： 板
AD9279
Rev. 0 | Page 32 of 44
Two output clocks are provided to assist in capturing data from
the AD9279. DCO± is used to clock the output data and is equal
to six times the sampling clock rate. Data is clocked out of the
AD9279 and must be captured on the rising and falling edges
of DCO±, which supports double data rate (DDR) capturing.
The frame clock output (FCO±) is used to signal the start of a
new output byte and is equal to the sampling clock rate. See the
timing diagram shown in Figure 2 for more information.
An 8-, 10-, or 14-bit serial stream can also be initiated from the
SPI. This allows the user to implement different serial streams and
to test device compatibility with lower and higher resolution
systems. When changing the resolution to an 8- or 10-bit serial
stream, the data stream is shortened. When using the 14-bit
option, the data stream stuffs two 0s at the end of the normal
12-bit serial data.
When using the SPI, all of the data outputs can also be inverted
from their nominal state by setting Bit 2 in the OUTPUT_MODE
register (Address 0x14). This is not to be confused with inverting
the serial stream to an LSB first mode. In default mode, as shown
in Figure 2, the MSB is represented first in the data output serial
stream. However, this order this can be inverted so that the LSB is
represented first in the data output serial stream (see Figure 3).
There are 12 digital output test pattern options available that
can be initiated through the SPI. This feature is useful when
validating receiver capture and timing. See Table 13 for the
output bit sequencing options available. Some test patterns have
two serial sequential words and can be alternated in various
ways, depending on the test pattern chosen. Note that some
patterns may not adhere to the data format select option. In
addition, custom user-defined test patterns can be assigned in
the user pattern registers (Address 0x19 through Address 0x1C).
All test mode options except PN sequence short and PN sequence
long can support 8- to 14-bit word lengths to verify data capture
to the receiver.
The PN sequence short pattern produces a pseudo random
bit sequence that repeats itself every 29 1 bits, or 511 bits. A
description of the PN sequence short and how it is generated
can be found in Section 5.1 of the ITU-T O.150 (05/96) standard.
The only difference is that the starting value is a specific value
instead of all 1s (see Table 14 for the initial values).
Table 13. Flexible Output Test Modes1
Output Test Mode
Bit Sequence
Pattern Name
Digital Output Word 1
Digital Output Word 2
Subject to Data
Format Select
0000
Off (default)
N/A
0001
Midscale short
1000 0000 0000
Same
Yes
0010
+Full-scale short
1111 1111 1111
Same
Yes
0011
Full-scale short
0000 0000 0000
Same
Yes
0100
Checkerboard
1010 1010 1010
0101 0101 0101
No
0101
PN sequence long
N/A
Yes
0110
PN sequence short
N/A
Yes
0111
One-/zero-word toggle
1111 1111 1111
0000 0000 0000
No
1000
User input
Register 0x19 and Register 0x1A
Register 0x1B and Register 0x1C
No
1001
1-/0-bit toggle
1010 1010 1010
N/A
No
1010
1× sync
0000 0011 1111
N/A
No
1011
One bit high
1000 0000 0000
N/A
No
1100
Mixed bit frequency
1010 0011 0011
N/A
No
1 N/A is not applicable.
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