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參數(shù)資料
| 型號： | ADUC7023BCPZ62I-RL |
| 廠商： | Analog Devices Inc |
| 文件頁數(shù)： | 27/96頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC MCU 12BIT 62KB FLASH 32LFCSP |
| 標準包裝： | 5,000 |
| 系列： | MicroConverter® ADuC7xxx |
| 核心處理器： | ARM7 |
| 芯體尺寸： | 16/32-位 |
| 速度： | 44MHz |
| 連通性： | I²C，SPI |
| 外圍設備： | POR，PWM，WDT |
| 輸入/輸出數(shù)： | 12 |
| 程序存儲器容量： | 64KB（32K x 16） |
| 程序存儲器類型： | 閃存 |
| RAM 容量： | 2K x 32 |
| 電壓 - 電源 (Vcc/Vdd)： | 2.7 V ~ 3.6 V |
| 數(shù)據(jù)轉(zhuǎn)換器： | A/D 8x12b，D/A 4x12b |
| 振蕩器型： | 內(nèi)部 |
| 工作溫度： | -40°C ~ 125°C |
| 封裝/外殼： | 32-WFQFN 裸露焊盤，CSP |
| 包裝： | 帶卷 (TR) |
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Data Sheet
ADuC7023
| Page 33 of 96
ADCGN Register
Name:
ADCGN
Address:
0xFFFF0530
Default value:
Factory configured
Access:
Read/write
Function:
ADCGN is a 10-bit gain calibration
register.
ADCOF Register
Name:
ADCOF
Address:
0xFFFF0534
Default value:
Factory configured
Access:
Read/write
Function:
ADCOF is a 10-bit offset calibration
register.
CONVERTER OPERATION
The ADC incorporates a successive approximation (SAR)
architecture involving a charge-sampled input stage. This
architecture can operate in two different modes: differential
and single-ended.
Differential Mode
The ADuC7023 contains a successive approximation ADC
based on two capacitive DACs. Figure 24 and Figure 25 show
simplified schematics of the ADC in acquisition and conversion
phase, respectively. The ADC is comprised of control logic, a
SAR, and two capacitive DACs. In Figure 24 (the acquisition
phase), SW3 is closed and SW1 and SW2 are in Position A. The
comparator is held in a balanced condition, and the sampling
capacitor arrays acquire the differential signal on the input.
08675-
017
CAPACITIVE
DAC
CAPACITIVE
DAC
CONTROL
LOGIC
COMPARATOR
SW3
SW1
A
B
SW2
CS
VREF
ADC0
ADC11
MUX
CHANNEL+
CHANNEL–
Figure 24. ADC Acquisition Phase
08675-
018
CAPACITIVE
DAC
CAPACITIVE
DAC
CONTROL
LOGIC
COMPARATOR
SW3
SW1
A
B
SW2
CS
VREF
ADC0
ADC11
MUX
CHANNEL+
CHANNEL–
Figure 25. ADC Conversion Phase
When the ADC starts a conversion, as shown in Figure 25,
SW3 opens, and then SW1 and SW2 move to Position B. This
causes the comparator to become unbalanced. Both inputs are
disconnected once the conversion begins. The control logic
and the charge redistribution DACs are used to add and
subtract fixed amounts of charge from the sampling capacitor
arrays to bring the comparator back into a balanced condition.
When the comparator is rebalanced, the conversion is complete.
The control logic generates the ADC output code. The output
impedances of the sources driving the VIN+ and VIN– pins must
be matched; otherwise, the two inputs have different settling
times, resulting in errors.
Single-Ended Mode
In single-ended mode, SW2 is always connected internally to
ground. The VIN pin can be floating. The input signal range on
VIN+ is 0 V to VREF.
08675-
020
CAPACITIVE
DAC
CAPACITIVE
DAC
CONTROL
LOGIC
COMPARATOR
SW3
SW1
A
B
CS
ADC0
ADC11
MUX
CHANNEL+
CHANNEL–
Figure 26. ADC in Single-Ended Mode
Analog Input Structure
Figure 27 shows the equivalent circuit of the analog input structure
of the ADC. The four diodes provide ESD protection for the analog
inputs. Care must be taken to ensure that the analog input signals
never exceed the supply rails by more than 300 mV; this causes
these diodes to become forward-biased and start conducting
into the substrate. These diodes can conduct up to 10 mA
without causing irreversible damage to the part.
Rev. E
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