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| 型號： | DS3154N+ |
| 廠商： | Maxim Integrated Products |
| 文件頁數(shù)： | 28/61頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC LIU DS3/E3/STS-1 QD 144CSBGA |
| 產(chǎn)品培訓(xùn)模塊： | Lead (SnPb) Finish for COTS Obsolescence Mitigation Program |
| 標(biāo)準(zhǔn)包裝： | 160 |
| 類型： | 線路接口裝置（LIU） |
| 驅(qū)動器/接收器數(shù)： | 4/4 |
| 規(guī)程： | IEEE 1149.1 |
| 電源電壓： | 3.135 V ~ 3.465 V |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 144-BGA，CSPBGA |
| 供應(yīng)商設(shè)備封裝： | 144-TECSBGA（13x13） |
| 包裝： | 管件 |
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DS3151/DS3152/DS3153/DS3154 Single/Dual/Triple/Quad DS3/E3/STS-1 LIUs
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Shift-DR. The test data register selected by the current instruction is connected between JTDI and JTDO and shifts
data one stage toward its serial output on each rising edge of JTCLK. If a test register selected by the current
instruction is not placed in the serial path, it maintains its previous state.
Exit1-DR. While in this state, a rising edge on JTCLK with JTMS high puts the controller in the Update-DR state,
which terminates the scanning process. A rising edge on JTCLK with JTMS low puts the controller in the Pause-DR
state.
Pause-DR. Shifting of the test registers is halted while in this state. All test registers selected by the current
instruction retain their previous state. The controller remains in this state while JTMS is low. A rising edge on
JTCLK with JTMS high puts the controller in the Exit2-DR state.
Exit2-DR. While in this state, a rising edge on JTCLK with JTMS high puts the controller in the Update-DR state
and terminates the scanning process. A rising edge on JTCLK with JTMS low puts the controller in the Shift-DR
state.
Update-DR. A falling edge on JTCLK while in the Update-DR state latches the data from the shift register path of
the test registers into the data output latches. This prevents changes at the parallel output because of changes in
the shift register. A rising edge on JTCLK with JTMS low puts the controller in the Run-Test-Idle state. With JTMS
high, the controller enters the Select-DR-Scan state.
Select-IR-Scan. All test registers retain their previous state. The instruction register remains unchanged during this
state. With JTMS low, a rising edge on JTCLK moves the controller into the Capture-IR state and initiates a scan
sequence for the instruction register. JTMS high during a rising edge on JTCLK puts the controller back into the
Test-Logic-Reset state.
Capture-IR. The Capture-IR state is used to load the shift register in the instruction register with a fixed value. This
value is loaded on the rising edge of JTCLK. If JTMS is high on the rising edge of JTCLK, the controller enters the
Exit1-IR state. If JTMS is low on the rising edge of JTCLK, the controller enters the Shift-IR state.
Shift-IR. In this state, the instruction register’s shift register is connected between JTDI and JTDO and shifts data
one stage for every rising edge of JTCLK toward the serial output. The parallel register and the test registers
remain at their previous states. A rising edge on JTCLK with JTMS high moves the controller to the Exit1-IR state.
A rising edge on JTCLK with JTMS low keeps the controller in the Shift-IR state, while moving data one stage
through the instruction shift register.
Exit1-IR. A rising edge on JTCLK with JTMS low puts the controller in the Pause-IR state. If JTMS is high on the
rising edge of JTCLK, the controller enters the Update-IR state and terminates the scanning process.
Pause-IR. Shifting of the instruction register is halted temporarily. With JTMS high, a rising edge on JTCLK puts
the controller in the Exit2-IR state. The controller remains in the Pause-IR state if JTMS is low during a rising edge
on JTCLK.
Exit2-IR. A rising edge on JTCLK with JTMS high puts the controller in the Update-IR state. The controller loops
back to the Shift-IR state if JTMS is low during a rising edge of JTCLK in this state.
Update-IR. The instruction shifted into the instruction shift register is latched into the parallel output on the falling
edge of JTCLK as the controller enters this state. Once latched, this instruction becomes the current instruction. A
rising edge on JTCLK with JTMS low puts the controller in the Run-Test-Idle state. With JTMS high, the controller
enters the Select-DR-Scan state.
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| DS3154N# | 功能描述:網(wǎng)絡(luò)控制器與處理器 IC Quad DS3/E3/STS-1 Line Interface Unit RoHS:否 制造商:Micrel 產(chǎn)品:Controller Area Network (CAN) 收發(fā)器數(shù)量: 數(shù)據(jù)速率: 電源電流（最大值）:595 mA 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:PBGA-400 封裝:Tray |
| DS3154N+ | 功能描述:網(wǎng)絡(luò)控制器與處理器 IC Quad DS3/E3/STS-1 Line Interface Unit RoHS:否 制造商:Micrel 產(chǎn)品:Controller Area Network (CAN) 收發(fā)器數(shù)量: 數(shù)據(jù)速率: 電源電流（最大值）:595 mA 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:PBGA-400 封裝:Tray |
| DS3154NA2 | 功能描述:網(wǎng)絡(luò)控制器與處理器 IC Quad DS3/E3/STS-1 Line Interface Unit RoHS:否 制造商:Micrel 產(chǎn)品:Controller Area Network (CAN) 收發(fā)器數(shù)量: 數(shù)據(jù)速率: 電源電流（最大值）:595 mA 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:PBGA-400 封裝:Tray |
| DS3154NB1 | 制造商:Maxim Integrated Products 功能描述:DS3154B QUAD DS3/E3 LIU IND - Rail/Tube 制造商:Maxim Integrated Products 功能描述:DS3/E3/STS-1 LIUS |
| DS3154NCA2 | 制造商:Rochester Electronics LLC 功能描述: 制造商:Maxim Integrated Products 功能描述: |
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