參數(shù)資料
型號: DSP56F805FV80E
廠商: Freescale Semiconductor
文件頁數(shù): 11/56頁
文件大?。?/td> 0K
描述: IC DSP 80MHZ 64KB FLASH 144LQFP
標準包裝: 60
系列: 56F8xx
核心處理器: 56800
芯體尺寸: 16-位
速度: 80MHz
連通性: CAN,EBI/EMI,SCI,SPI
外圍設(shè)備: POR,PWM,WDT
輸入/輸出數(shù): 32
程序存儲器容量: 71KB(35.5K x 16)
程序存儲器類型: 閃存
RAM 容量: 2.5K x 16
電壓 - 電源 (Vcc/Vdd): 3 V ~ 3.6 V
數(shù)據(jù)轉(zhuǎn)換器: A/D 8x12b
振蕩器型: 外部
工作溫度: -40°C ~ 85°C
封裝/外殼: 144-LQFP
包裝: 托盤
JTAG/OnCE
56F805 Technical Data, Rev. 16
Freescale Semiconductor
19
2.14 JTAG/OnCE
Part 3 Specifications
3.1 General Characteristics
The 56F805 is fabricated in high-density CMOS with 5V-tolerant TTL-compatible digital inputs. The term
“5V-tolerant” refers to the capability of an I/O pin, built on a 3.3V-compatible process technology, to
withstand a voltage up to 5.5V without damaging the device. Many systems have a mixture of devices
designed for 3.3V and 5V power supplies. In such systems, a bus may carry both 3.3V and 5V-compatible
I/O voltage levels (a standard 3.3V I/O is designed to receive a maximum voltage of 3.3V
± 10% during
Table 2-18 JTAG/On-Chip Emulation (OnCE) Signals
No. of
Pins
Signal
Name
Signal
Type
State During
Reset
Signal Description
1
TCK
Input
(Schmitt)
Input, pulled
low internally
Test Clock Input—This input pin provides a gated clock to
synchronize the test logic and shift serial data to the JTAG/OnCE
port. The pin is connected internally to a pull-down resistor.
1
TMS
Input
(Schmitt)
Input, pulled
high internally
Test Mode Select Input—This input pin is used to sequence the
JTAG TAP controller’s state machine. It is sampled on the rising
edge of TCK and has an on-chip pull-up resistor.
Note:
Always tie the TMS pin to VDD through a 2.2K resistor.
1
TDI
Input
(Schmitt)
Input, pulled
high internally
Test Data Input—This input pin provides a serial input data stream
to the JTAG/OnCE port. It is sampled on the rising edge of TCK and
has an on-chip pull-up resistor.
1
TDO
Output
Tri-stated
Test Data Output—This tri-statable output pin provides a serial
output data stream from the JTAG/OnCE port. It is driven in the
Shift-IR and Shift-DR controller states, and changes on the falling
edge of TCK.
1
TRST
Input
(Schmitt)
Input, pulled
high internally
Test Reset—As an input, a low signal on this pin provides a reset
signal to the JTAG TAP controller. To ensure complete hardware
reset, TRST should be asserted at power-up and whenever RESET
is asserted. The only exception occurs in a debugging environment
when a hardware device reset is required and it is necessary not to
reset the OnCE/JTAG module. In this case, assert RESET, but do
not assert TRST.
Note:
For normal operation, connect TRST directly to VSS. If the design
is to be used in a debugging environment, TRST may be tied to VSS
through a 1K resistor.
1
DE
Output
Debug Event—DE provides a low pulse on recognized debug
events.
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