參數(shù)資料
型號: FRE160D
廠商: INTERSIL CORP
元件分類: JFETs
英文描述: 41A, 100V, 0.050 Ohm, Rad Hard, N-Channel Power MOSFETs
中文描述: 41 A, 100 V, 0.05 ohm, N-CHANNEL, Si, POWER, MOSFET, TO-258AA
文件頁數(shù): 3/6頁
文件大?。?/td> 49K
代理商: FRE160D
4-39
Post-Radiation Electrical Specifications
TC = +25
o
C, Unless Otherwise Specified
PARAMETER
SYMBOL
TYPE
TEST CONDITIONS
LIMITS
UNITS
MIN
MAX
Drain-Source
Breakdown Volts
(Note 4,6)
BVDSS
FRE160D, R
VGS = 0, ID = 1mA
100
-
V
(Note 5,6)
BVDSS
FRE160H
VGS = 0, ID = 1mA
95
-
V
Gate-Source
Threshold Volts
(Note 4,6)
VGS(th)
FRE160D, R
VGS = VDS, ID = 1mA
2.0
4.0
V
(Note 3,5,6)
VGS(th)
FRE160H
VGS = VDS, ID = 1mA
1.5
4.5
V
Gate-Body
Leakage Forward
(Note 4,6)
IGSSF
FRE160D, R
VGS = 20V, VDS = 0
-
100
nA
(Note 5,6)
IGSSF
FRE160H
VGS = 20V, VDS = 0
-
200
nA
Gate-Body
Leakage Reverse
(Note 2,4,6)
IGSSR
FRE160D, R
VGS = -20V, VDS = 0
-
100
nA
(Note 2,5,6)
IGSSR
FRE160H
VGS = -20V, VDS = 0
-
200
nA
Zero-Gate Voltage
Drain Current
(Note 4,6)
IDSS
FRE160D, R
VGS = 0, VDS = 80V
-
25
μ
A
(Note 5,6)
IDSS
FRE160H
VGS = 0, VDS = 80V
-
100
μ
A
Drain-Source
On-State Volts
(Note 1,4,6)
VDS(on)
FRE160D, R
VGS = 10V, ID = 41A
-
2.15
V
(Note 1,5,6)
VDS(on)
FRE160H
VGS = 16V, ID = 41A
-
3.23
V
Drain-Source
On Resistance
(Note 1,4,6)
RDS(on)
FRE160D, R
VGS = 10V, ID = 26A
-
.050
(Note 1,5,6)
RDS(on)
FRE160H
VGS = 14V, ID = 26A
-
.075
NOTES:
1. Pulse test, 300
μ
s max
2. Absolute value
3. Gamma = 300KRAD(Si)
4. Gamma = 10KRAD(Si) for “D”, 100KRAD(Si) for “R”. Neutron = 3E13
5. Gamma = 1000KRAD(Si). Neutron = 3E13
6. Insitu Gamma bias must be sampled for both VGS = +10V, VDS = 0V and VGS = 0V, VDS = 80% BVDSS
7. Gamma data taken 6/11/89 on TA 17661 devices by GE ASTRO SPACE; EMC/SURVIVABILITY LABORATORY; KING OF PRUSSIA,
PA 19401
8. Single event drain burnout testing by Titus, J.L., et al of NWSC, Crane, IN at Brookhaven Nat. Lab. Dec 11-14, 1989
9. Neutron derivation, INTERSIL Application note AN-8831, Oct. 1988
FRE160D, FRE160R, FRE160H
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