參數(shù)資料
型號: ICSSSTUBF32866Az(LF)T
英文描述: 25-Bit Configurable Registered Buffer for DDR2
中文描述: 25位可配置的注冊緩沖DDR2內(nèi)存
文件頁數(shù): 26/28頁
文件大小: 308K
代理商: ICSSSTUBF32866AZ(LF)T
26
ICSSSTUBF32866A
Advance Information
1240—07/17/06
Test circuits and switching waveforms (cont’d)
3.4 Partial-parity-out load circuit and voltage measurement information (V
DD
= 1.8 V ± 0.1 V)
All input pulses are supplied by generators having the following characteristics: PRR
Z
o
= 50
input slew rate = 1 V/ns ± 20%, unless otherwise specified.
10 MHz;
(1) C
L
includes probe and jig capacitance.
Figure 32 — Partial-parity-out load circuit,
V
TT
= V
DD
/2
t
PLH
an t
PHL
are the same as t
PD
.
V
I(PP)
= 600 mV
Figure 33 — Partial-parity-out voltage waveforms; propagation delay times with respect to clock inputs
V
TT
= V
DD
/2
t
PLH
an t
PHL
are the same as t
PD
.
V
IH
= V
REF
+ 250 mV (AC voltage levels for differential inputs. V
IH
= V
DD
for LVCMOS inputs.
V
IL
= V
REF
- 250 mV (AC voltage levels) for differential inputs. V
IL
= V
DD
for LVCMOS inputs.
Figure 34 — Partial-parity-out voltage waveforms; propagation delay times with respect to reset input
VOH
VOL
OUTPUT
tPLH
002aaa375
VTT
VICR
VICR
tPHL
CK
CK
Vi(p-p)
tPHL
002aaa376
LVCMOS RST#
INPUT
OUTPUT
VTT
VDD/2
VIH
VIL
VOH
VOL
DUT
Out
Test Point
RL=
CL =
5 pF
(see Note A)
1 k
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