參數(shù)資料
型號(hào): LH28F320BFHE-PBTLZ2
廠商: Sharp Corporation
英文描述: 32M (x16) Flash Memory
中文描述: 32M的(x16)的快閃記憶體
文件頁(yè)數(shù): 20/36頁(yè)
文件大小: 689K
代理商: LH28F320BFHE-PBTLZ2
LHF32FD2 18
TEST POINTS
V
CCQ
/2
V
CCQ
/2
INPUT
V
CCQ
0.0
OUTPUT
AC test inputs are driven at V
(min) for a Logic "1" and 0.0V for a Logic "0".
Input timing begins, and output timing ends at V
CCQ
/2. Input rise and fall times (10% to 90%) < 5ns.
Worst case speed conditions are when V
CC
=V
CC
(min).
DEVICE
UNDER
TEST
RL=3.3k
CL
V
CCQ
(min)/2
OUT
CL Includes Jig
Capacitances.
1N914
Figure 6. Transient Equivalent Testing Load Circuit
Rev. 2.44
Table 13. Configuration Capacitance Loading Value
Test Configuration
C
L
(pF)
V
CC
=2.7V-3.6V
50
1.2.2 AC Input/Output Test Conditions
1.2.1 Capacitance
(1)
(T
A
=
+
25
°
C, f=1MHz)
NOTE:
1. Sampled, not 100% tested.
Parameter
Symbol
C
IN
C
OUT
Condition
V
IN
=0.0V
V
OUT
=0.0V
Min.
Typ.
Max.
Unit
Input Capacitance
4
7
pF
Output Capacitance
6
10
pF
Figure 5. Transient Input/Output Reference Waveform for V
CC
=2.7V-3.6V
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