參數(shù)資料
型號(hào): M29W800AB100ZA5T
廠商: 意法半導(dǎo)體
英文描述: 8 Mbit 1Mb x8 or 512Kb x16, Boot Block Low Voltage Single Supply Flash Memory
中文描述: 8兆1兆x8或512KB的x16插槽,引導(dǎo)塊低壓?jiǎn)坞娫撮W存
文件頁(yè)數(shù): 13/33頁(yè)
文件大?。?/td> 234K
代理商: M29W800AB100ZA5T
13/33
M29W800AT, M29W800AB
Figure 5. AC Testing Input Output Waveform
AI01417
3V
0V
1.5V
Figure 6. AC Testing Load Circuit
AI01968
0.8V
OUT
CL= 30pF or 100pF
CLincludes JIG capacitance
3.3k
1N914
DEVICE
UNDER
TEST
Table 13. Capacitance
(1)
(T
A
= 25
°
C, f = 1 MHz)
Symbol
Parameter
Note: Sampled only, not 100% tested.
Table 14. DC Characteristics
(T
A
= 0 to 70
°
C, –20 to 85
°
C or –40 to 85
°
C; V
CC
= 2.7V to 3.6V)
Note: 1. Sampled only, not 100% tested.
Test Condition
Min
Max
Unit
C
IN
Input Capacitance
V
IN
= 0V
6
pF
C
OUT
Output Capacitance
V
OUT
= 0V
12
pF
Symbol
Parameter
Test Condition
Min
Typ.
Max
Unit
I
LI
Input Leakage Current
0V
V
IN
V
CC
±
1
μ
A
I
LO
Output Leakage Current
0V
V
OUT
V
CC
±
1
μ
A
I
CC1
Supply Current (Read by Word)
E = V
IL
, G = V
IH
, f = 6MHz
3
10
mA
I
CC2
Supply Current (Read by Word)
E = V
IL
, G = V
IL
, f = 6MHz
4.5
10
mA
I
CC3
Supply Current (Stan-by)
E = V
CC
±
0.2V
30
100
μ
A
I
CC4(1)
Supply Current
(Program or Erase)
Byte program, Block or
Chip Erase in progress
20
mA
V
IL
Input Low Voltage
–0.5
0.8
V
V
IH
Input High Voltage
0.7 V
CC
V
CC
+ 0.3
V
V
OL
Output Low Voltage
I
OL
= 1.8mA
0.45
V
V
OH
Output High Voltage CMOS
I
OH
= –100
μ
A
V
CC
–0.4V
V
V
ID
A9 Voltage (Electronic Signature)
11.5
12.5
V
I
ID
A9 Current (Electronic Signature)
A9 = V
ID
30
100
μ
A
V
LKO(1)
Supply Voltage (Erase and
Program lock-out)
2.0
2.3
V
Table 12. AC Measurement Conditions
Input Rise and Fall Times
10ns
Input Pulse Voltages
0 to 3V
Input and Output Timing Ref. Voltages
1.5V
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