參數(shù)資料
型號: MSP430F1101IPWR
廠商: TEXAS INSTRUMENTS INC
元件分類: 微控制器/微處理器
英文描述: 16-BIT, FLASH, 8 MHz, RISC MICROCONTROLLER, PDSO20
封裝: PLASTIC, TSSOP-20
文件頁數(shù): 20/43頁
文件大?。?/td> 869K
代理商: MSP430F1101IPWR
MSP430C11x1, MSP430F11x1A
MIXED SIGNAL MICROCONTROLLER
SLAS241I SEPTEMBER 1999 REVISED DECEMBER 2008
27
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
APPLICATION INFORMATION
Port P1, P1.4 to P1.7, input/output with Schmitt trigger and in-system access features
EN
D
See Note 1
See Note 2
See Note 1
GND
VCC
P1.4P1.7
0
1
0
1
Interrupt
Edge
Select
EN
Set
Q
P1IE.x
P1IFG.x
P1IRQ.x
Interrupt
Flag
P1IES.x
P1SEL.x
Module X IN
P1IN.x
P1OUT.x
Module X OUT
Direction Control
From Module
P1DIR.x
P1SEL.x
Pad Logic
Bus Keeper
TST
Fuse
60 k
Ω
Fuse
Blow
Control
Control By JTAG
0
1
TDO
Controlled By JTAG
P1.x
TDI
P1.x
TST
TMS
TST
TCK
TST
Controlled by JTAG
TST
P1.x
NOTE: The test pin should be protected from potential EMI
and ESD voltage spikes. This may require a smaller
external pulldown resistor in some applications.
x = Bit identifier, 4 to 7 for port P1
During programming activity and during blowing
of the fuse, the pin TDO/TDI is used to apply the test
input for JTAG circuitry.
P1.7/TDI/TDO
P1.6/TDI/TCLK
P1.5/TMS
P1.4/TCK
Typical
TEST
GND
PnSel.x
PnDIR.x
Direction
control from
module
PnOUT.x
Module X OUT
PnIN.x
Module X IN
PnIE.x
PnIFG.x
PnIES.x
P1Sel.4
P1DIR.4
P1OUT.4
SMCLK
P1IN.4
unused
P1IE.4
P1IFG.4
P1IES.4
P1Sel.5
P1DIR.5
P1OUT.5
Out0 signal
P1IN.5
unused
P1IE.5
P1IFG.5
P1IES.5
P1Sel.6
P1DIR.6
P1OUT.6
Out1 signal
P1IN.6
unused
P1IE.6
P1IFG.6
P1IES.6
P1Sel.7
P1DIR.7
P1OUT.7
Out2 signal
P1IN.7
unused
P1IE.7
P1IFG.7
P1IES.7
Signal from or to Timer_A
NOTES:
1. Optional selection of pullup or pulldown resistors with ROM (masked) versions
2. Fuses for optional pullup and pulldown resistors can only be programmed at the factory (ROM versions only).
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