參數(shù)資料
型號: P28F010-120
廠商: INTEL CORP
元件分類: PROM
英文描述: 1024K (128K x 8) CMOS FLASH MEMORY
中文描述: 128K X 8 FLASH 12V PROM, 120 ns, PDIP32
封裝: 0.620 X 1.640 INCH, PLASTIC, DIP-32
文件頁數(shù): 20/30頁
文件大?。?/td> 405K
代理商: P28F010-120
28F010
AC TESTING INPUT/OUTPUT
WAVEFORM
(1)
290207–7
AC test inputs are driven at V
OH
(2.4 V
TTL
) for a Logic
‘‘1’’ and V
OL
(0.45 V
TTL
) for a Logic ‘‘0’’. Input timing
begins at V
IH
(2.0 V
TTL
) and V
IL
(0.8 V
TTL
). Output tim-
ing ends at V
IH
and V
IL
. Input rise and fall times (10%
to 90%)
k
10 ns.
HIGH SPEED AC TESTING INPUT/OUTPUT
WAVEFORM
(2)
290207–8
AC test inputs are driven at 3.0V for a Logic ‘‘1’’ and
0.0V for a Logic ‘‘0’’. Input timing begins, and output
timing ends, at 1.5V. Input rise and fall times (10% to
90%)
k
10 ns.
AC TESTING LOAD CIRCUIT
(1)
C
L
e
100 pF
C
L
includes Jig Capacitance
R
L
e
3.3 K
X
290207–22
HIGH SPEED AC TESTING LOAD CIRCUIT
(2)
C
L
e
30 pF
C
L
includes Jig Capacitance
R
L
e
3.3 K
X
290207–23
AC TEST CONDITIONS
(1)
Input Rise and Fall Times (10% to 90%)àààààà10 ns
Input Pulse Levels àààààààààààààààà0.45V and 2.4V
Input Timing Reference Level ààààààà0.8V and 2.0V
Output Timing Reference Level àààààà0.8V and 2.0V
Capacitive Loadàààààààààààààààààààààààààà100 pF
HIGH-SPEED AC TEST CONDITIONS
(2)
Input Rise and Fall Times (10% to 90%)àààààà10 ns
Input Pulse Levels ààààààààààààààààà0.0V and 3.0V
Input Timing Reference Levelàààààààààààààààà1.5V
Output Timing Reference Level àààààààààààààà1.5V
Capacitive Loadààààààààààààààààààààààààààà30 pF
NOTES:
1. Testing characteristics for 28F010-65 in standard configuration, and 28F010-90, 28F010-120, and 28F010-150.
2. Testing characteristics for 28F010-65 in high speed configuration.
20
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相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
P28F010150 制造商:INTEL 功能描述:*
P28F010-150 制造商:Intel 功能描述:
P28F010-200 制造商:未知廠家 制造商全稱:未知廠家 功能描述:x8 Flash EEPROM
P28F010-65 制造商:INTEL 制造商全稱:Intel Corporation 功能描述:1024K (128K x 8) CMOS FLASH MEMORY
P28F010-90 制造商:INTEL 制造商全稱:Intel Corporation 功能描述:1024K (128K x 8) CMOS FLASH MEMORY