參數(shù)資料
型號(hào): PLS159
廠商: NXP Semiconductors N.V.
英文描述: Programmable logic sequencer 16 】 45 】 12
中文描述: 可編程序邏輯16】45】12
文件頁(yè)數(shù): 6/12頁(yè)
文件大?。?/td> 132K
代理商: PLS159
Philips Semiconductors Programmable Logic Devices
Product specification
PLS159A
Programmable logic sequencer
(16
×
45
×
12)
October 22, 1993
30
AC ELECTRICAL CHARACTERISTICS
0
°
C
T
amb
+75
°
C, 4.75V
V
CC
5.25V, R
1
=470
, R
2
= 1k
LIMITS
TYP
1
SYMBOL
PARAMETER
FROM
TO
TEST CONDITION
MIN
MAX
UNIT
Pulse width
t
CKH
t
CKL
t
CKP
t
PRH
Setup time
5
Clock
2
High
CK +
CK –
C
L
= 30pF
C
L
= 30pF
C
L
= 30pF
C
L
= 30pF
20
15
ns
Clock Low
CK –
CK +
20
15
ns
Period
CK +
CK +
55
45
ns
Preset/Reset pulse
(I,B) –
(I,B) +
35
30
ns
t
IS1
t
IS2
Input
(I,B)
±
F
±
CK +
C
L
= 30pF
C
L
= 30pF
35
30
ns
Input (through F
n
)
Input (through
Complement Array)
4
CK +
15
10
ns
t
IS3
(I,B)
±
CK +
C
L
= 30pF
55
45
ns
Hold time
t
IH1
t
IH2
Propagation delay
Input
(I,B)
±
F
±
CK +
C
L
= 30pF
C
L
= 30pF
0
–5
ns
Input (through F
n
)
CK +
15
10
ns
t
CKO
t
OE1
t
OD1
t
PD
t
OE2
t
OD2
t
PRO
t
PPR
Clock
Output enable
3
Output disable
3
CK +
F
±
C
L
= 30pF
C
L
= 30pF
C
L
= 5pF
C
L
= 30pF
C
L
= 30pF
C
L
= 5pF
C
L
= 30pF
C
L
= 30pF
15
20
ns
OE –
F –
20
30
ns
OE +
F +
20
30
ns
Output
Output enable
3
Output disable
3
(I,B)
±
B
±
B
±
25
35
ns
(I,B) +
20
30
ns
(I,B) –
B +
20
30
ns
Preset/Reset
(I,B) +
F
±
35
45
ns
Power-on/preset
V
CC
+
F –
0
10
ns
NOTES:
1. All typical values are at V
= 5V, T
= +25
°
C.
2. To prevent spurious clocking, clock rise time (10% – 90%)
10ns.
3. For 3-State output; output enable times are tested with C
L
= 30pF to the 1.5V level, and S
1
is open for high-impedance to High tests and
closed for high-impedance to Low tests. Output disable times are tested with C
L
= 5pF. High-to-High impedance tests are made to an output
voltage of V
T
= (V
OH
– 0.5V) with S
1
open, and Low-to-High impedance tests are made to the V
T
= (V
OL
+ 0.5V) level with S
1
closed.
4. When using the Complement Array t
CKP
= 75ns (min).
5. Limits are guaranteed with 12 product terms maximum connected to each sum term line.
VOLTAGE WAVEFORMS
MEASUREMENTS:
All circuit delays are measured at the +1.5V level
of inputs and outputs, unless otherwise specified.
90%
10%
5ns
5ns
5ns
5ns
90%
10%
+3.0V
+3.0V
0V
0V
t
R
t
F
Input Pulses
TEST LOAD CIRCUIT
+5V
C
L
R
1
R
2
S
1
GND
B
Z
B
Y
INPUTS
I
0
I
n
B
W
B
X
CLK
OUTPUTS
C
2
C
1
DUT
NOTE:
C
1
and C
2
are to bypass V
CC
to GND.
V
CC
OE
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