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參數(shù)資料
| 型號(hào)： | PLS159AN |
| 廠(chǎng)商： | NXP SEMICONDUCTORS |
| 元件分類(lèi)： | PLD |
| 英文描述： | Programmable logic sequencer 16 】 45 】 12 |
| 中文描述： | OT PLD, 35 ns, PDIP20 |
| 封裝： | 0.300 INCH, PLASTIC, DIP-20 |
| 文件頁(yè)數(shù)： | 5/12頁(yè) |
| 文件大小： | 132K |
| 代理商： | PLS159AN |
Philips Semiconductors Programmable Logic Devices
Product specification
PLS159A
Programmable logic sequencer
(16
×
45
×
12)
October 22, 1993
29
DC ELECTRICAL CHARACTERISTICS
0
°
C
≤
T
amb
≤
+75
°
C, 4.75V
≤
V
CC
≤
5.25V
LIMITS
SYMBOL
PARAMETER
TEST CONDITION
MIN
TYP
1
MAX
UNIT
Input voltage
2
V
IH
V
IL
High
V
CC
= MAX
V
CC
= MIN
2.0
V
Low
0.8
V
V
IC
Output voltage
2
Clamp
V
CC
= MIN, I
IN
= –12mA
–0.8
–1.2
V
V
OH
High
V
CC
= MIN, I
OH
= –2mA
2.4
V
V
OL
Low
I
OL
= 10mA
0.35
0.5
V
Input current
I
IH
High
V
CC
= MAX, V
IN
= 5.5V
<1
80
μ
A
I
IL
Low
V
IN
= 0.45V
–10
–100
μ
A
Output current
I
O(OFF)
Hi-Z state
4, 7
V
CC
= MAX, V
OUT
= 5.5V
1
80
μ
A
V
OUT
= 0.45V
–1
–140
μ
A
I
OS
Short circuit
3, 5
V
OUT
= 0V
–15
–70
mA
I
CC
V
CC
supply current
6
V
CC
= MAX
150
190
mA
Capacitance
C
IN
Input
V
CC
= 5.0V, V
IN
= 2.0V
8
pF
C
OUT
Output
V
OUT
= 2.0V
15
pF
NOTES:
1. All typical values are at V
= 5V, T
= +25
°
C.
2. All voltage values are with respect to network ground terminal.
3. Test one at a time.
4. Measured with V
IH
applied to OE.
5. Duration of short circuit should not exceed 1 second.
6. I
CC
is measured with the OE input grounded, all other inputs at 4.5V and the outputs open.
7. Leakage values are a combination of input and output leakage.
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