參數(shù)資料
型號(hào): SI824XCLASSD-KIT
廠商: Silicon Laboratories Inc
文件頁(yè)數(shù): 3/30頁(yè)
文件大小: 0K
描述: BOARD EVAL FOR SI824X
標(biāo)準(zhǔn)包裝: 1
放大器類型: D 類
輸出類型: 2 通道(立體聲)
在某負(fù)載時(shí)最大輸出功率 x 通道數(shù)量: 120W x 2 @ 8 歐姆
板類型: 完全填充
已用 IC / 零件: Si824x
已供物品:
其它名稱: 336-2002
Si824x
Rev. 1.0
11
Figure 5. NB SOIC-16, Thermal Derating Curve, Dependence of Safety Limiting Values with Case
Temperature per DIN EN 60747-5-2
Table 7. Thermal Characteristics
Parameter
Symbol
NB
SOIC-16
Unit
IC Junction-to-Air
Thermal Resistance
JA
105
°C/W
Table 8. Absolute Maximum Ratings1
Parameter
Symbol
Min
Typ
Max
Units
Storage Temperature2
TSTG
–65
+150
°C
Ambient Temperature under Bias
TA
–40
+125
°C
Input-side Supply Voltage
VDDI
–0.6
6.0
V
Driver-side Supply Voltage
VDDA, VDDB
–0.6
30
V
Voltage on any Pin with respect to Ground
VIN
–0.5
VDD + 0.5
V
Output Drive Current per Channel
IO
——
10
mA
Lead Solder Temperature (10 sec)
260
°C
Latchup Immunity3
——
100
V/ns
Maximum Isolation (Input to Output)
2500
VRMS
Maximum Isolation (Output to Output)
1500
VRMS
Notes:
1. Permanent device damage may occur if the absolute maximum ratings are exceeded. Functional operation should be
restricted to the conditions as specified in the operational sections of this data sheet. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
2. VDE certifies storage temperature from –40 to 150 °C.
3. Latchup immunity specification is for slew rate applied across GNDI and GNDA or GNDB.
0
200
150
100
50
60
40
20
0
Case Temperature (C)
Safe
ty-L
im
it
ing
Cu
rre
n
t
(mA
)
VDDI = 5.5 V
VDDA, VDDB = 24 V
10
30
50
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