參數(shù)資料
型號(hào): SN54ABTH18652A
廠商: Texas Instruments, Inc.
英文描述: Scan Test Devices With 18 Bit Universal Bus Transceivers and Registers( 掃描檢測(cè)裝置,帶18位總線收發(fā)器和寄存器)
中文描述: 掃描測(cè)試設(shè)備與18位通用總線收發(fā)器和寄存器(掃描檢測(cè)裝置,帶18位總線收發(fā)器和寄存器)
文件頁(yè)數(shù): 35/36頁(yè)
文件大?。?/td> 848K
代理商: SN54ABTH18652A
SN54ABTH18652A, SN54ABTH182652A, SN74ABTH18652A, SN74ABTH182652A
SCAN TEST DEVICES WITH
18-BIT BUS TRANSCEIVERS AND REGISTERS
SCBS167D – AUGUST 1993 – REVISED JULY 1996
35
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
1.5 V
th
tsu
From Output
Under Test
CL = 50 pF
(see Note A)
LOAD CIRCUIT
S1
7 V
Open
GND
500
500
Data Input
Timing Input
1.5 V
3 V
0 V
1.5 V
1.5 V
3 V
0 V
3 V
0 V
1.5 V
1.5 V
tw
Input
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
INVERTING AND NONINVERTING OUTPUTS
VOLTAGE WAVEFORMS
PULSE DURATION
tPLH
tPHL
tPHL
tPLH
VOH
VOH
VOL
VOL
1.5 V
1.5 V
3 V
0 V
1.5 V
1.5 V
Input
1.5 V
Output
Control
Output
Waveform 1
S1 at 7 V
(see Note B)
Output
Waveform 2
S1 at Open
(see Note B)
VOL
VOH
tPZL
tPZH
tPLZ
tPHZ
1.5 V
1.5 V
3.5 V
0 V
1.5 V
VOL + 0.3 V
1.5 V
VOH – 0.3 V
0 V
3 V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
LOW- AND HIGH-LEVEL ENABLING
Output
Output
tPLH/tPHL
tPLZ/tPZL
tPHZ/tPZH
Open
7 V
Open
TEST
S1
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR
10 MHz, ZO = 50
, tr
2.5 ns, tf
2.5 ns.
D. The outputs are measured one at a time with one transition per measurement.
Figure 15. Load Circuit and Voltage Waveforms
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參數(shù)描述
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SN54ABTH245J 制造商:TI 制造商全稱:Texas Instruments 功能描述:OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS
SN54ABTH245W 制造商:TI 制造商全稱:Texas Instruments 功能描述:OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS