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參數(shù)資料
| 型號(hào)： | UPD753036GK |
| 廠(chǎng)商： | NEC Corp. |
| 英文描述： | DIODE ZENER SINGLE 500mW 75Vz 1.7mA-Izt 0.05 0.1uA-Ir 56Vr DO35-GLASS 5K/REEL |
| 中文描述： | 4位單片機(jī) |
| 文件頁(yè)數(shù)： | 37/88頁(yè) |
| 文件大?。?/td> | 483K |
| 代理商： | UPD753036GK |
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37
μ
PD753036, 753036(A)
Data Sheet U11353EJ4V0DS00
7. INTERRUPT FUNCTION AND TEST FUNCTION
The
μ
PD753036 has eight interrupt sources and two test sources. Of the test sources, INT2 has two types
of edge-detected testable inputs.
The interrupt control circuit of the
μ
PD753036 has the following functions:
(1) Interrupt function
Vectored interrupt function for hardware control, enabling/disabling the interrupt acceptance by the
interrupt enable flag (IE
×××
) and interrupt master enable flag (IME).
Can set any interrupt start address.
Nesting wherein the order of priority can be specified by the interrupt priority select register (IPS).
Test function of interrupt request flag (IRQ
×××
). An interrupt generated can be checked by software.
Release the standby mode. A release interrupt can be selected by the interrupt enable flag.
G
G
G
G
G
(2) Test function
Test request flag (IRQ
×××
) generation can be checked by software.
Release the standby mode. The test source to be released can be selected by the test enable
G
G
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