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125
μ
PD75517(A)
5. INTERRUPT FUNCTION
The
μ
PD75517(A) has nine interrupt sources and can handle multiple interrupts with a priority.
The
μ
PD75517(A) is also provided with two features for accepting testable interrupts.
Table 5-1 Interrupt Sources
Notes 1.
The priority is used when two or more interrupt requests are issued at a time.
2.
See
(3)
in
Section 5.2
for details on INT2.
The following functions are provided for the interrupt control circuit of the
μ
PD75517(A).
(a) Vectored interrupt function under hardware control which can determine whether to accept an interrupt
by an interrupt enable flag (IE
×××
) and the interrupt master enable flag (IME)
(b) Any interrupt start address can be set.
(c) Multiple interrupt function which can specify the priority by the interrupt priority specification register
(IPS)
(d) Test function of an interrupt request flag (IRQ
×××
)
(The software can confirm that an interrupt occurred.)
(e) Release of the standby mode (Interrupts released by an interrupt enable flag can be selected.)
5.1 CONFIGURATION OF THE INTERRUPT CONTROL CIRCUIT
The interrupt control circuit of the
μ
PD75517(A) is configured as shown in Fig. 5-1. Each hardware item
is mapped in the data memory space.
Vectored interrupt
request signal (vector
table address)
In/out
INTBT
(Reference time interval signal from basic
interval timer)
INT4
(Detection of both rising and falling edges)
INT0
(Rising/falling edge detection specification)
INT1
INTCSI0
(Serial data transfer completion signal)
INTT0
(Match signal between programmable timer/
counter count register and modulo register)
INTTPG
(Match signal from timer/pulse generator)
INT2
(Rising edge detection for an INT2 pin input
signal, or falling edge detection for either of
KR0 to KR7 pin input signals)
Note 2
INTW
(Signal from clock timer)
Interrupt source
In
Out
Out
Out
In
In
In
Out
In
Priority
Note 1
1
2
3
4
5
6
VRQ1 (0002H)
VRQ2 (0004H)
VRQ3 (0006H)
VRQ4 (0008H)
VRQ5 (000AH)
VRQ6 (000CH)
Testable input signal (Sets IRQ2 and IRQW.)