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參數(shù)資料
| 型號： | W72M64V-XBX |
| 英文描述： | Flash MCP |
| 中文描述： | 閃存MCP的 |
| 文件頁數(shù)： | 4/15頁 |
| 文件大小： | 160K |
| 代理商： | W72M64V-XBX |
4
White Electronic Designs Corporation Phoenix AZ (602) 437-1520
W72M64V-X BX
Parameter
Symbol
-100
Min Max Min Max Min Max
100
120
0
0
45
50
0
0
45
50
0
0
45
50
30
30
300
15
0
0
108
-120
-150
Unit
Write Cycle Time
Write Enable Setup Time
Chip Select Pulse Width
Address Setup Time
Data Setup Time
Data Hold Time
Address Hold Time
Chip Select Pulse Width High
Duration of Byte Programming Operation (1)
Sector Erase Time (2)
Read Recovery Time Before Write (3)
Chip Programming Time (4)
t
AVAV
t
WLEL
t
ELEH
t
AVWL
t
DVEH
t
EHDX
t
ELAX
t
EHEL
t
WHWH1
t
WHWH2
t
GHEL
t
WC
t
WS
t
CP
t
AS
t
DS
t
DH
t
AH
t
CPH
150
0
50
0
50
0
50
30
ns
ns
ns
ns
ns
ns
ns
ns
μs
sec
ns
sec
300
15
300
15
0
108
108
1. Typical value for t
WHWH
1
is 7μs.
2. Typical value for t
WHWH
2
is 0.7 sec.
3. Guaranteed by design, but not tested.
4. Typical value is 36 sec. The typical chip programming time is considerably less than the maximum chip programming time
listed, since most bytes program faster than the maximum program times listed.
AC CHARACTERISTICS – WRITE/ERASE/PROGRAM OPERATIONS - CS CONTROLLED
(V
CC
= 3.3V ± 0.3V, T
A
= -55°C to +125°C)
FIG 2:
AC TEST CIRCUIT
AC TEST CONDITIONS
NOTES:
V
Z
is programmable from -2V to +7V.
I
OL
& I
OH
programmable from 0 to 16mA.
Tester Impedance Z
0
= 75
.
V
Z
is typically the midpoint of V
OH
and V
OL
.
I
OL
& I
OH
are adjusted to simulate a typical resistive
load circuit.
ATE tester includes jig capacitance.
Parameter
Input Pulse Levels
Input Rise and Fall
Input and Output Reference Level 1.5 V
Output Timing Reference Level 1.5 V
Typ Unit
V
IL
= 0, V
IH
= 2.5
V
5 ns
Current Source
Current Source
I
OL
I
OH
C
EFF
= 50 pf
V
Z
≈
1.5V
(Bipolar Supply
D.U.T.
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