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參數(shù)資料
| 型號： | 5962-0050401QYC |
| 廠商： | ATMEL CORP |
| 元件分類： | ADC |
| 英文描述： | 1-CH 8-BIT PROPRIETARY METHOD ADC, PARALLEL ACCESS, CQFP68 |
| 封裝： | CERAMIC, QFP-68 |
| 文件頁數(shù)： | 3/57頁 |
| 文件大?。?/td> | 1276K |
| 代理商： | 5962-0050401QYC |
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11
TS8388B
2144C–BDC–04/03
Explanation of
Test Levels
Notes:
1. Unless otherwise specified, all tests are pulsed tests: therefore Tj = Tc = Ta, where Tj, Tc
and Ta are junction, case and ambient temperature respectively.
2. Refer to “Ordering Information” on page 50.
3. Only MIN and MAX values are guaranteed (typical values are issuing from characterization
results).
Functions
Description
Table 4. Explanation of Test Levels
Num
Characteristics
1
100% production tested at +25
2
100% production tested at +25
°C(1), and sample tested at specified temperatures
(for “V” and “M” Temperature range(2)).
3
Sample tested only at specified temperatures.
4
Parameter is guaranteed by design and characterization testing (thermal steady-state
conditions at specified temperature).
5
Parameter is a typical value only.
6
100% production tested over specified temperature range
(for “B/Q” Temperature range(2)).
Table 5. Functions Description
Name
Function
VCC
Positive power supply
V
EE
Analog negative power supply
VPLUSD
Digital positive power supply
GND
Ground
V
IN, VINB
Differential analog inputs
CLK, CLKB
Differential clock inputs
<D0:D7>
<D0B:D7B>
Differential output data port
DR, DRB
Differential data ready outputs
OR, ORB
Out of range outputs
GAIN
ADC gain adjust
GORB
Gray or Binary digital output select
DIOD/DRRB
Die junction temperature measurement/
asynchronous data ready reset
VIN
VINB
CLK
CLKB
D0
D7
D0B
D7B
16
DVEE = -5V
VCC = +5V
VPLUSD = +0V (ECL)
VPLUSD = +2.4V (LVDS)
TS8388B
VEE = -5V
GND
GAIN
GORG
DIOD/
DRRB
OR
ORB
DR
DRB
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