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參數(shù)資料
| 型號(hào)： | 935262451557 |
| 廠商： | NXP SEMICONDUCTORS |
| 元件分類： | 顏色信號(hào)轉(zhuǎn)換 |
| 英文描述： | COLOR SIGNAL DECODER, PQFP100 |
| 封裝： | 14 X 14 X 1.40 MM, PLASTIC, SOT-407, LQFP-100 |
| 文件頁(yè)數(shù)： | 114/144頁(yè) |
| 文件大?。?/td> | 592K |
| 代理商： | 935262451557 |
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2000 Mar 15
71
Philips Semiconductors
Preliminary specication
PAL/NTSC/SECAM video decoder with adaptive PAL/NTSC
comb lter, VBI-data slicer and high performance scaler
SAA7114H
10 BOUNDARY SCAN TEST
The SAA7114H has built in logic and 5 dedicated pins to
support boundary scan testing which allows board testing
without special hardware (nails). The SAA7114H follows
the
“IEEE Std. 1149.1 - Standard Test Access Port and
Boundary-Scan Architecture” set by the Joint Test Action
Group (JTAG) chaired by Philips.
The 5 special pins are Test Mode Select (TMS), Test
Clock (TCK), Test Reset (TRST), Test Data Input (TDI)
and Test Data Output (TDO).
The Boundary Scan Test (BST) functions BYPASS,
EXTEST, INTEST, SAMPLE, CLAMP and IDCODE are all
supported (see Table 33). Details about the
JTAG BST-TEST can be found in the specification “
IEEE
Std. 1149.1”. A file containing the detailed Boundary Scan
Description Language (BSDL) description of the
SAA7114H is available on request.
Table 33 BST instructions supported by the SAA7114H
INSTRUCTION
DESCRIPTION
BYPASS
This mandatory instruction provides a minimum length serial path (1 bit) between TDI and TDO
when no test operation of the component is required.
EXTEST
This mandatory instruction allows testing of off-chip circuitry and board level interconnections.
SAMPLE
This mandatory instruction can be used to take a sample of the inputs during normal operation of
the component. It can also be used to preload data values into the latched outputs of the
boundary scan register.
CLAMP
This optional instruction is useful for testing when not all ICs have BST. This instruction addresses
the bypass register while the boundary scan register is in external test mode.
IDCODE
This optional instruction will provide information on the components manufacturer, part number and
version number.
INTEST
This optional instruction allows testing of the internal logic (no customer support available).
USER1
This private instruction allows testing by the manufacturer (no customer support available).
10.1
Initialization of boundary scan circuit
The TAP (Test Access Port) controller of an IC should be
in the reset state (TEST_LOGIC_RESET) when the IC is
in functional mode. This reset state also forces the
instruction register into a functional instruction such as
IDCODE or BYPASS.
To solve the power-up reset, the standard specifies that
the TAP controller will be forced asynchronously to the
TEST_LOGIC_RESET state by setting the TRST pin
LOW.
10.2
Device identication codes
A device identification register is specified in
“IEEE Std.
1149.1b-1994”. It is a 32-bit register which contains fields
for the specification of the IC manufacturer, the IC part
number and the IC version number. Its biggest advantage
is the possibility to check for the correct ICs mounted after
production and determination of the version number of ICs
during field service.
When the IDCODE instruction is loaded into the BST
instruction register, the identification register will be
connected between TDI and TDO of the IC.
The identification register will load a component specific
code during the CAPTURE_DATA_REGISTER state of
the TAP controller and this code can subsequently be
shifted out. At board level this code can be used to verify
component manufacturer, type and version number. The
device identification register contains 32 bits, numbered
31 to 0, where bit 31 is the most significant bit (nearest to
TDI) and bit 0 is the least significant bit (nearest to TDO);
see Fig.38.
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