參數(shù)資料
型號: A40MX04-VQG80A
元件分類: FPGA
英文描述: FPGA, 6000 GATES, PQFP80
封裝: PLASTIC, VQFP-80
文件頁數(shù): 6/78頁
文件大?。?/td> 515K
代理商: A40MX04-VQG80A
40MX and 42MX Automotive FPGA Families
1- 10
v3.0
JTAG Mode Activation
The JTAG test logic circuit is activated in the Designer
software by selecting Tools and then Device Selection.
This brings up the Device Selection dialog box as shown
in Figure 1-14. The JTAG test logic circuit can be enabled
by clicking the "Reserve JTAG Pins" check box. Table 1-5
explains the pins' behavior in either mode.
TRST Pin and TAP Controller Reset
An active reset (TRST) pin is not supported; however, MX
devices contain power-on circuitry that resets the
boundary-scan circuitry upon power-up. Also, the TMS
pin is equipped with an internal pull-up resistor. This
allows the TAP controller to remain in or return to the
Test-Logic-Reset state when there is no input or when a
logical 1 is on the TMS pin. To reset the controller, TMS
must be HIGH for at least five TCK cycles.
Boundary Scan Description Language
(BSDL) File
Conforming to the IEEE Standard 1149.1 requires that
the operation of the various JTAG components be
documented. The BSDL file provides the standard format
to describe the JTAG components that can be used by
automatic test equipment software. The file includes the
instructions that are supported, instruction-bit pattern,
and the boundary-scan chain order. For an in-depth
discussion on BSDL files, please refer to Actel BSDL Files
Format Description application note.
Actel BSDL files are grouped into two categories—
generic and device-specific. The generic files assign all
user I/Os as inouts. Device-specific files assign user I/Os as
inputs, outputs, or inouts.
Generic files for MX devices are available on Actel's website
Figure 1-14 Device Selection Wizard
Table 1-5 Boundary Scan Pin Configuration and Functionality
Reserve JTAG
Checked
Unchecked
TCK
BST input; must be terminated to logical HIGH or LOW to avoid floating
User I/O
TDI, TMS
BST input; may float or be tied to HIGH. TDI may be tied to TDO of another device
User I/O
TDO
BST output; may float or be connected to TDI of another device
User I/O
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