TA = 25°C, unless o" />
參數(shù)資料
型號(hào): AD5755-1ACPZ-REEL7
廠商: Analog Devices Inc
文件頁(yè)數(shù): 4/52頁(yè)
文件大小: 0K
描述: IC DAC 16BIT SERIAL 64LFCSP
視頻文件: AD5755: 16-Bit Multi-Channel, Voltage and Current Output DAC
標(biāo)準(zhǔn)包裝: 750
設(shè)置時(shí)間: 11µs
位數(shù): 16
數(shù)據(jù)接口: DSP,MICROWIRE?,QSPI?,串行,SPI?
轉(zhuǎn)換器數(shù)目: 4
電壓電源: 模擬和數(shù)字,雙 ±
工作溫度: -40°C ~ 105°C
安裝類(lèi)型: 表面貼裝
封裝/外殼: 64-VFQFN 裸露焊盤(pán),CSP
供應(yīng)商設(shè)備封裝: 64-LFCSP-VQ(9x9)
包裝: 帶卷 (TR)
輸出數(shù)目和類(lèi)型: 4 電流,4 電壓
采樣率(每秒): *
AD5755-1
Data Sheet
Rev. E | Page 12 of 52
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted. Transient currents of up to
100 mA do not cause SCR latch-up.
Table 4.
Parameter
Rating
AVDD, VBOOST_x to AGND, DGND
0.3 V to +33 V
AVSS to AGND, DGND
+0.3 V to 28 V
AVDD to AVSS
0.3 V to +60 V
AVCC to AGND
0.3 V to +7 V
DVDD to DGND
0.3 V to +7 V
Digital Inputs to DGND
0.3 V to DVDD + 0.3 V or +7 V
(whichever is less)
Digital Outputs to DGND
0.3 V to DVDD + 0.3 V or +7 V
(whichever is less)
REFIN, REFOUT to AGND
0.3 V to AVDD + 0.3 V or +7 V
(whichever is less)
VOUT_x to AGND
AVSS to VBOOST_x or 33 V if using
the dc-to-dc circuitry
+VSENSE_x to AGND
AVSS to VBOOST_x or 33 V if using
the dc-to-dc circuitry
IOUT_x to AGND
AVSS to VBOOST_x or 33 V if using
the dc-to-dc circuitry
SWx to AGND
0.3 to +33 V
AGND, GNDSWx to DGND
0.3 V to +0.3 V
Operating Temperature Range (TA)
Industrial1
40°C to +105°C
Storage Temperature Range
65°C to +150°C
Junction Temperature (TJ max)
125°C
64-Lead LFCSP
θJA Thermal Impedance2
28°C/W
Power Dissipation
(TJ max TA)/θJA
Lead Temperature
JEDEC industry standard
Soldering
J-STD-020
1 Power dissipated on chip must be derated to keep the junction temperature
below 125°C.
2 Based on a JEDEC 4-layer test board.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
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