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| 型號(hào)： | AD5765BSUZ-REEL7 |
| 廠商： | Analog Devices Inc |
| 文件頁(yè)數(shù)： | 8/28頁(yè) |
| 文件大?。?/td> | 0K |
| 描述： | IC DAC 16BIT 5V QUAD 32-TQFP |
| 產(chǎn)品培訓(xùn)模塊： | Data Converter Fundamentals DAC Architectures |
| 產(chǎn)品變化通告： | AD5763/65 Metal Layer Edit Change 08/Sept/2009 |
| 設(shè)計(jì)資源： | High Accuracy, Bipolar Voltage Output Digital-to-Analog Conversion Using AD5765 (CN0073) |
| 標(biāo)準(zhǔn)包裝： | 500 |
| 設(shè)置時(shí)間： | 8µs |
| 位數(shù)： | 16 |
| 數(shù)據(jù)接口： | 串行 |
| 轉(zhuǎn)換器數(shù)目： | 4 |
| 電壓電源： | 雙 ± |
| 功率耗散（最大）： | 76mW |
| 工作溫度： | -40°C ~ 105°C |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 32-TQFP |
| 供應(yīng)商設(shè)備封裝： | 32-TQFP（7x7） |
| 包裝： | 帶卷 (TR) |
| 輸出數(shù)目和類型： | 4 電壓，雙極 |
| 采樣率（每秒）： | * |
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AD5765
Data Sheet
Rev. C | Page 16 of 28
TERMINOLOGY
Relative Accuracy or Integral Nonlinearity (INL)
For the DAC, relative accuracy or integral nonlinearity (INL) is
a measure of the maximum deviation, in LSBs, from a straight
line passing through the endpoints of the DAC transfer
function. A typical INL vs. code plot can be seen in Figure 7.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of ±1 LSB maximum
ensures monotonicity. This DAC is guaranteed monotonic. A
typical DNL vs. code plot can be seen in Figure 8.
Monotonicity
A DAC is monotonic if the output either increases or remains
constant for increasing digital input code. The AD5765 is
monotonic over its full operating temperature range.
Bipolar Zero Error
Bipolar zero error is the deviation of the analog output from the
ideal half-scale output of 0 V when the DAC register is loaded
with 0x8000 (offset binary coding) or 0x0000 (twos complement
coding). A plot of bipolar zero error vs. temperature can be seen
in Figure 13.
Bipolar Zero Temperature Coefficient (TC)
Bipolar zero temperature coefficient is the measure of the
change in the bipolar zero error with a change in temperature. It
is expressed as (ppm FSR)/°C.
Full-Scale Error
Full-scale error is a measure of the output error when full-scale
code is loaded to the DAC register. Ideally, the output voltage
should be 2 × VREF 1 LSB. Full-scale error is expressed as a
percentage of the full-scale range.
Negative Full-Scale Error/Zero Scale Error
Negative full-scale error is the error in the DAC output voltage
when 0x0000 (offset binary coding) or 0x8000 (twos complement
coding) is loaded to the DAC register. Ideally, the output voltage
is 2 × VREF. A plot of zero-scale error vs. temperature can be
seen in Figure 12.
Output Voltage Settling Time
Output voltage settling time is the amount of time it takes for the
output to settle to a specified level for a full-scale input change.
Slew Rate
The slew rate of a device is a limitation in the rate of change of
the output voltage. The output slewing speed of a voltage-
output DAC is usually limited by the slew rate of the amplifier
used at its output. Slew rate is measured from 10% to 90% of the
output signal and is given in V/s.
Gain Error
Gain error is a measure of the span error of the DAC. It is the
deviation in slope of the DAC transfer characteristic from the
ideal, expressed as a percentage of the full-scale range. A plot of
gain error vs. temperature can be seen in Figure 14.
Total Unadjusted Error (TUE)
Total unadjusted error (TUE) is a measure of the output error
considering all the various errors.
Zero-Scale Error Temperature Coefficient
Zero-scale error temperature coefficient is a measure of the
change in zero-scale error with a change in temperature. Zero-
scale error TC is expressed as (ppm FSR)/°C.
Gain Error Temperature Coefficient
Gain error temperature coefficient is a measure of the change in
gain error with changes in temperature. Gain error temperature
coefficient is expressed as (ppm of FSR)/°C.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV-sec
and is measured when the digital input code is changed by 1 LSB at
the major carry transition, 0x7FFF to 0x8000 (see Figure 20).
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into
the analog output of the DAC from the digital inputs of the DAC
but is measured when the DAC output is not updated. It is spec-
ified in nV-sec and is measured with a full-scale code change on
the data bus, that is, from all 0s to all 1s and vice versa.
Power Supply Sensitivity
Power supply sensitivity indicates how the output of the DAC is
affected by changes in the power supply voltage.
DC Crosstalk
DC crosstalk is the dc change in the output level of one DAC in
response to a change in the output of another DAC. It is
measured with a full-scale output change on one DAC while
monitoring another DAC and is expressed in LSBs.
DAC-to-DAC Crosstalk
DAC-to-DAC crosstalk is the glitch impulse transferred to the
output of one DAC due to a digital code change and subsequent
output change of another DAC. This includes both digital and
analog crosstalk. It is measured by loading one of the DACs
with a full-scale code change (all 0s to all 1s and vice versa) with
LDAC low and monitoring the output of another DAC. The
energy of the glitch is expressed in nV-sec.
Channel-to-Channel Isolation
Channel-to-channel isolation is the ratio of the amplitude of the
signal at the output of one DAC to a sine wave on the reference
input of another DAC. It is measured in decibels.
Digital Crosstalk
Digital crosstalk is a measure of the impulse injected into the
analog output of one DAC from the digital inputs of another
DAC but is measured when the DAC output is not updated. It is
specified in nV-sec and measured with a full-scale code change
on the data bus, that is, from all 0s to all 1s and vice versa.
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