參數(shù)資料
型號(hào)： AD7674ASTZRL
廠商： Analog Devices Inc
文件頁(yè)數(shù)： 15/28頁(yè)
文件大?。?/td> 0K
描述： IC ADC 18BIT 800KSPS 48-LQFP T/R
產(chǎn)品培訓(xùn)模塊： ADC Applications
ADC Architectures
ADC DC/AC Performance
標(biāo)準(zhǔn)包裝： 2,000
系列： PulSAR®
位數(shù)： 18
采樣率（每秒）： 800k
數(shù)據(jù)接口： 串行，并聯(lián)
轉(zhuǎn)換器數(shù)目： 1
功率耗散（最大）： 138mW
電壓電源： 模擬和數(shù)字
工作溫度： -40°C ~ 85°C
安裝類型： 表面貼裝
封裝/外殼： 48-LQFP
供應(yīng)商設(shè)備封裝： 48-LQFP（7x7）
包裝： 帶卷 (TR)
輸入數(shù)目和類型： 1 個(gè)差分，雙極
配用： EVAL-AD7674CBZ-ND - BOARD EVALUATION FOR AD7674
AD7674
Rev. A | Page 22 of 28
In Read after Conversion mode, it should be noted that unlike
in other modes, the BUSY signal returns low after the 18 data
bits are pulsed out and not at the end of the conversion phase,
which results in a longer BUSY width.
To accommodate slow digital hosts, the serial clock can be
slowed down by using DIVSCLK.
t3
BUSY
CS, RD
CNVST
SYNC
SCLK
SDOUT
12
3
16
17
18
D17
D16
D2
D1
D0
X
EXT/INT = 0
RDC/SDIN = 0
INVSCLK = INVSYNC = 0
t14
t20
t15
t16
t22
t23
t29
t28
t18
t19
t21
t30
t25
t24
t26
t27
03083-0-040
Figure 40. Master Serial Data Timing for Reading (Read after Convert)
RDC/SDIN = 1
INVSCLK = INVSYNC = 0
D17
D16
D2
D1
D0
X
12
3
16
17
18
BUSY
SYNC
SCLK
SDOUT
CS, RD
CNVST
t3
t1
t17
t14
t15
t19
t20
t21
t16
t22
t23
t24
t27
t26
t25
t18
EXT/INT = 0
03083-0-046
Figure 41. Master Serial Data Timing for Reading (Read Previous Conversion during Convert)
SLAVE SERIAL INTERFACE
External Clock
The AD7674 is configured to accept an externally supplied
serial data clock on the SCLK pin when the EXT/INT pin is
held high. In this mode, several methods can be used to read
the data. The external serial clock is gated by CS. When CS and
RD are both low, the data can be read after each conversion or
during the following conversion. The external clock can be
either a continuous or a discontinuous clock. A discontinuous
clock can be either normally high or normally low when
inactive. Figure 42 and Figure 43 show the detailed timing
diagrams of these methods.
While the AD7674 is performing a bit decision, it is important
that voltage transients not occur on digital input/output pins or
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