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| 型號(hào)： | ADN2817ACPZ |
| 廠商： | Analog Devices Inc |
| 文件頁(yè)數(shù)： | 11/40頁(yè) |
| 文件大?。?/td> | 0K |
| 描述： | IC CLOCK/DATA RECOVERY 32-LFCSP |
| 標(biāo)準(zhǔn)包裝： | 1 |
| 類(lèi)型： | 時(shí)鐘和數(shù)據(jù)恢復(fù)（CDR），多路復(fù)用器 |
| PLL： | 是 |
| 主要目的： | SONET/SDH |
| 輸入： | CML |
| 輸出： | CML |
| 電路數(shù)： | 1 |
| 比率 - 輸入:輸出： | 1:2 |
| 差分 - 輸入:輸出： | 是/是 |
| 頻率 - 最大： | 2.7GHz |
| 電源電壓： | 3 V ~ 3.6 V |
| 工作溫度： | -40°C ~ 85°C |
| 安裝類(lèi)型： | 表面貼裝 |
| 封裝/外殼： | 32-VFQFN 裸露焊盤(pán)，CSP |
| 供應(yīng)商設(shè)備封裝： | 32-LFCSP-VQ（5x5） |
| 包裝： | 托盤(pán) |
| 產(chǎn)品目錄頁(yè)面： | 788 (CN2011-ZH PDF) |
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Data Sheet
ADN2817/ADN2818
Rev. E | Page 19 of 40
JITTER SPECIFICATIONS
The ADN2817/ADN2818 CDR is designed to achieve the best
bit error rate (BER) performance and exceeds the jitter transfer,
generation, and tolerance specifications proposed for SONET/SDH
equipment defined in the Telcordia Technologies specification.
Jitter is the dynamic displacement of digital signal edges from
their long-term average positions, measured in unit intervals
(UI), where 1 UI = 1 bit period. Jitter on the input data can cause
dynamic phase errors on the recovered clock sampling edge. Jitter
on the recovered clock causes jitter on the retimed data.
The following sections briefly summarize the specifications
of jitter generation, transfer, and tolerance in accordance with
the Telcordia document (GR-253-CORE, Issue 3, September
2000) for the optical interface at the equipment level and the
ADN2817/ADN2818 performance with respect to those
specifications.
JITTER GENERATION
The jitter generation specification limits the amount of jitter
that can be generated by the device with no jitter and wander
applied at the input. For OC-48 devices, the band-pass filter
has a 12 kHz high-pass cutoff frequency with a roll-off of
20 dB/decade and a low-pass cutoff frequency of at least
20 MHz. The jitter generated must be less than 0.01 UI rms
and must be less than 0.1 UI p-p.
JITTER TRANSFER
The jitter transfer function is the ratio of the jitter on the output
signal to the jitter applied on the input signal vs. the frequency.
This parameter measures the limited amount of the jitter on
an input signal that can be transferred to the output signal
0.1
ACCEPTABLE
RANGE
fC
JITTER FREQUENCY (kHz)
SLOPE = –20dB/DECADE
JI
TTE
R
GA
IN
(
d
B
)
0
60
01-
01
5
Figure 26. Jitter Transfer Curve
JITTER TOLERANCE
The jitter tolerance is defined as the peak-to-peak amplitude of
the sinusoidal jitter applied on the input signal, which causes a
1 dB power penalty. This is a stress test intended to ensure that
no additional penalty is incurred under the operating conditions
(see Figure 27).
15.00
1.50
0.15
f0
f1
f2
f3
f4
JITTER FREQUENCY (kHz)
SLOPE = –20dB/DECADE
IN
P
U
T
J
ITT
E
R
A
M
P
L
ITU
D
E
(
U
I
p-
p
)
060
01
-01
6
Figure 27. SONET Jitter Tolerance Mask
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| ADN2817ACPZ-RL | 制造商:AD 制造商全稱(chēng):Analog Devices 功能描述:Continuous Rate 10 Mbps to 2.7 Gbps Clock and Data Recovery ICs |
| ADN2817ACPZ-RL7 | 功能描述:IC CLOCK/DATA RECOVERY 32-LFCSP RoHS:是 類(lèi)別:集成電路 (IC) >> 時(shí)鐘/計(jì)時(shí) - 專(zhuān)用 系列:- 標(biāo)準(zhǔn)包裝:28 系列:- 類(lèi)型:時(shí)鐘/頻率發(fā)生器 PLL:是 主要目的:Intel CPU 服務(wù)器 輸入:時(shí)鐘 輸出:LVCMOS 電路數(shù):1 比率 - 輸入:輸出:3:22 差分 - 輸入:輸出:無(wú)/是 頻率 - 最大:400MHz 電源電壓:3.135 V ~ 3.465 V 工作溫度:0°C ~ 85°C 安裝類(lèi)型:表面貼裝 封裝/外殼:64-TFSOP （0.240"，6.10mm 寬） 供應(yīng)商設(shè)備封裝:64-TSSOP 包裝:管件 |
| ADN2817XCPX | 制造商:Analog Devices 功能描述:CONTINUOUS RATE 12.3MB/S TO 2.7GB/S CLOCK AND DATA RECOVERY - Trays |
| ADN2817XCPZ | 制造商:Analog Devices 功能描述:CONTINUOUS RATE 12.3MB/S TO 2.7GB/S CLOCK AND DATA RECOVERY - Gel-pak, waffle pack, wafer, diced wafer on film |
| ADN2818 | 制造商:AD 制造商全稱(chēng):Analog Devices 功能描述:Continuous Rate 12.3Mb/s to 2.7Gb/s Clock and Data Recovery ICs |
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