參數(shù)資料
型號(hào)： CY28548ZXCT
廠商： Silicon Laboratories Inc
文件頁(yè)數(shù)： 17/30頁(yè)
文件大小： 0K
描述： IC CLK CK505 960M/965M 64TSSOP
標(biāo)準(zhǔn)包裝： 2,000
類(lèi)型： 時(shí)鐘/頻率發(fā)生器
PLL： 是
主要目的： Intel CPU 服務(wù)器
輸入： 時(shí)鐘
輸出： LVCMOS
電路數(shù)： 1
比率 - 輸入:輸出： 3:22
差分 - 輸入:輸出： 無(wú)/是
頻率 - 最大： 400MHz
電源電壓： 3.135 V ~ 3.465 V
工作溫度： 0°C ~ 85°C
安裝類(lèi)型： 表面貼裝
封裝/外殼： 64-TFSOP （0.240"，6.10mm 寬）
供應(yīng)商設(shè)備封裝： 64-TSSOP
包裝： 帶卷 (TR)
CY28548
......................Document #: 001-08400 Rev ** Page 24 of 30
AC Electrical Specifications
Parameter
Description
Condition
Min.
Max.
Unit
Crystal
TDC
XIN Duty Cycle
The device operates reliably with input
duty cycles up to 30/70 but the REF clock
duty cycle will not be within specification
47.5
52.5
%
TPERIOD
XIN Period
When XIN is driven from an external
clock source
69.841
71.0
ns
TR/TF
XIN Rise and Fall Times
Measured between 0.3VDD and 0.7VDD
–10.0
ns
TCCJ
XIN Cycle to Cycle Jitter
As an average over 1-
s duration
–
500
ps
LACC
Long-term Accuracy
–
300
ppm
CPU at 0.7V
TDC
CPUT and CPUC Duty Cycle
Measured at 0V differential at 0.1s
45
55
%
TPERIOD
100 MHz CPUT and CPUC Period
Measured at 0V differential at 0.1s
9.99900
10.0100
ns
TPERIOD
133 MHz CPUT and CPUC Period
Measured at 0V differential at 0.1s
7.49925
7.50075
ns
TPERIOD
166 MHz CPUT and CPUC Period
Measured at 0V differential at 0.1s
5.99940
6.00060
ns
TPERIOD
200 MHz CPUT and CPUC Period
Measured at 0V differential at 0.1s
4.99950
5.00050
ns
TPERIOD
266 MHz CPUT and CPUC Period
Measured at 0V differential at 0.1s
3.74963
3.75038
ns
TPERIOD
333 MHz CPUT and CPUC Period
Measured at 0V differential at 0.1s
2.99970
3.00030
ns
TPERIOD
400 MHz CPUT and CPUC Period
Measured at 0V differential at 0.1s
2.49975
2.50025
ns
TPERIODSS
100 MHz CPUT and CPUC Period, SSC Measured at 0V differential at 0.1s
10.02406
10.02607
ns
TPERIODSS
133 MHz CPUT and CPUC Period, SSC Measured at 0V differential at 0.1s
7.51804
7.51955
ns
TPERIODSS
166 MHz CPUT and CPUC Period, SSC Measured at 0V differential at 0.1s
6.01444
6.01564
ns
TPERIODSS
200 MHz CPUT and CPUC Period, SSC Measured at 0V differential at 0.1s
5.01203
5.01303
ns
TPERIODSS
266 MHz CPUT and CPUC Period, SSC Measured at 0V differential at 0.1s
3.75902
3.75978
ns
TPERIODSS
333 MHz CPUT and CPUC Period, SSC Measured at 0V differential at 0.1s
3.00722
3.00782
ns
TPERIODSS
400 MHz CPUT and CPUC Period, SSC Measured at 0V differential at 0.1s
2.50601
2.50652
ns
TPERIODAbs
100 MHz CPUT and CPUC Absolute
period
Measured at 0V differential at 1 clock
9.91400
10.0860
ns
TPERIODAbs
133 MHz CPUT and CPUC Absolute
period
Measured at 0V differential at 1 clock
7.41425
7.58575
ns
TPERIODAbs
166 MHz CPUT and CPUC Absolute
period
Measured at 0V differential @ 1 clock
5.91440
6.08560
ns
TPERIODAbs
200 MHz CPUT and CPUC Absolute
period
Measured at 0V differential @ 1 clock
4.91450
5.08550
ns
TPERIODAbs
266 MHz CPUT and CPUC Absolute
period
Measured at 0V differential @ 1 clock
3.66463
3.83538
ns
TPERIODAbs
333 MHz CPUT and CPUC Absolute
period
Measured at 0V differential @ 1 clock
2.91470
3.08530
ns
TPERIODAbs
400 MHz CPUT and CPUC Absolute
period
Measured at 0V differential @ 1 clock
2.41475
2.58525
ns
TPERIODSSAbs 100 MHz CPUT and CPUC Absolute
period, SSC
Measured at 0V differential @ 1 clock
9.91406
10.1362
ns
TPERIODSSAbs 133 MHz CPUT and CPUC Absolute
period, SSC
Measured at 0V differential @ 1 clock
7.41430
7.62340
ns
TPERIODSSAbs 166 MHz CPUT and CPUC Absolute
period, SSC
Measured at 0V differential @ 1 clock
5.91444
6.11572
ns
TPERIODSSAbs 200 MHz CPUT and CPUC Absolute
period, SSC
Measured at 0V differential @ 1 clock
4.91453
5.11060
ns
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