參數(shù)資料
型號： DSP56F803BU80E
廠商： Freescale Semiconductor
文件頁數(shù)： 9/52頁
文件大?。?/td> 0K
描述： IC DSP 80MHZ 64KB FLASH 100LQFP
特色產品： DSP56F803 Digital Signal Controller
標準包裝： 90
系列： 56F8xx
核心處理器： 56800
芯體尺寸： 16-位
速度： 80MHz
連通性： CAN，EBI/EMI，SCI，SPI
外圍設備： POR，PWM，WDT
輸入/輸出數(shù)： 16
程序存儲器容量： 71KB（35.5K x 16）
程序存儲器類型： 閃存
RAM 容量： 2.5K x 16
電壓 - 電源 (Vcc/Vdd)： 3 V ~ 3.6 V
數(shù)據(jù)轉換器： A/D 8x12b
振蕩器型： 外部
工作溫度： -40°C ~ 85°C
封裝/外殼： 100-LQFP
包裝： 托盤
JTAG/OnCE
56F803 Technical Data, Rev. 16
Freescale Semiconductor
17
2.13 JTAG/OnCE
Part 3 Specifications
3.1 General Characteristics
The 56F803 is fabricated in high-density CMOS with 5-V tolerant TTL-compatible digital inputs. The
term “5-V tolerant” refers to the capability of an I/O pin, built on a 3.3V-compatible process technology,
to withstand a voltage up to 5.5V without damaging the device. Many systems have a mixture of devices
designed for 3.3V and 5V power supplies. In such systems, a bus may carry both 3.3V and 5V-compatible
I/O voltage levels (a standard 3.3V I/O is designed to receive a maximum voltage of 3.3V
± 10% during
normal operation without causing damage). This 5V-tolerant capability therefore offers the power savings
of 3.3V I/O levels while being able to receive 5V levels without being damaged.
Table 2-17 JTAG/On-Chip Emulation (OnCE) Signals
No. of
Pins
Signal
Name
Signal
Type
State During
Reset
Signal Description
1
TCK
Input
(Schmitt)
Input, pulled low
internally
Test Clock Input—This input pin provides a gated clock to synchronize the
test logic and shift serial data to the JTAG/OnCE port. The pin is connected
internally to a pull-down resistor.
1
TMS
Input
(Schmitt)
Input, pulled
high internally
Test Mode Select Input—This input pin is used to sequence the JTAG
TAP controller’s state machine. It is sampled on the rising edge of TCK and
has an on-chip pull-up resistor.
Note:
Always tie the TMS pin to VDD through a 2.2K resistor.
1
TDI
Input
(Schmitt)
Input, pulled
high internally
Test Data Input—This input pin provides a serial input data stream to the
JTAG/OnCE port. It is sampled on the rising edge of TCK and has an
on-chip pull-up resistor.
1
TDO
Output
Tri-stated
Test Data Output—This tri-statable output pin provides a serial output data
stream from the JTAG/OnCE port. It is driven in the Shift-IR and Shift-DR
controller states, and changes on the falling edge of TCK.
1
TRST
Input
(Schmitt)
Input, pulled
high internally
Test Reset—As an input, a low signal on this pin provides a reset signal to
the JTAG TAP controller. To ensure complete hardware reset, TRST
should be asserted at power-up and whenever RESET is asserted. The
only exception occurs in a debugging environment when a hardware device
reset is required and it is necessary not to reset the OnCE/JTAG module. In
this case, assert RESET, but do not assert TRST.
Note:
For normal operation, connect TRST directly to VSS. If the design is to be
used in a debugging environment, TRST may be tied to VSS through a 1K resistor.
1
DE
Output
Debug Event—DE provides a low pulse on recognized debug events.
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