參數(shù)資料
| 型號： | ISL12082IB8Z |
| 廠商： | Intersil |
| 文件頁數(shù)： | 22/26頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC RTC I2C LO-POWER 8-SOIC |
| 標準包裝： | 980 |
| 類型： | 時鐘/日歷 |
| 特點： | 警報器，閏年，監(jiān)視計時器 |
| 時間格式： | HH:MM:SS:hh（12/24 小時） |
| 數(shù)據格式： | YY-MM-DD-dd |
| 接口： | I²C，2 線串口 |
| 電源電壓： | 2.7 V ~ 5.5 V |
| 電壓 - 電源，電池： | 1.8 V ~ 5.5 V |
| 工作溫度： | -40°C ~ 85°C |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 8-SOIC（0.154"，3.90mm 寬） |
| 供應商設備封裝： | 8-SOIC |
| 包裝： | 管件 |
5
FN6731.3
November 24, 2008
Cpin
SDA and SCL Pin Capacitance
TA = +25°C, f = 1MHz, VDD = 5V, VIN =0V,
VOUT = 0V
10
pF
fSCL
SCL Frequency
400
kHz
tIN
Pulse Width Suppression Time at
SDA and SCL Inputs
Any pulse narrower than the max spec is
suppressed
50
ns
tAA
SCL Falling Edge to SDA Output
Data Valid
SCL falling edge crossing 30% of VDD, until
SDA exits the 30% to 70% of VDD window
900
ns
tBUF
Time the Bus Must Be Free Before
the Start of a New Transmission
SDA crossing 70% of VDD during a STOP
condition, to SDA crossing 70% of VDD
during the following START condition
1300
ns
tLOW
Clock LOW Time
Measured at the 30% of VDD crossing
1300
ns
tHIGH
Clock HIGH Time
Measured at the 70% of VDD crossing
600
ns
tSU:STA
START Condition Setup Time
SCL rising edge to SDA falling edge. Both
crossing 70% of VDD
600
ns
tHD:STA
START Condition Hold Time
From SDA falling edge crossing 30% of VDD
to SCL falling edge crossing 70% of VDD
600
ns
tSU:DAT
Input Data Setup Time
From SDA exiting the 30% to 70% of VDD
window, to SCL rising edge crossing 30% of
VDD
100
ns
tHD:DAT
Input Data Hold Time
From SCL falling edge crossing 30% of VDD
to SDA entering the 30% to 70% of VDD
window
0
900
ns
tSU:STO
STOP Condition Setup Time
From SCL rising edge crossing 70% of VDD,
to SDA rising edge crossing 30% of VDD
600
ns
tHD:STO
STOP Condition Hold Time
From SDA rising edge to SCL falling edge
Both crossing 70% of VDD
600
ns
tDH
Output Data Hold Time
From SCL falling edge crossing 30% of VDD,
until SDA enters the 30% to 70% of VDD
window
0ns
tR
SDA and SCL Rise Time
From 30% to 70% of VDD
20 +
0.1 x Cb
300
ns
tF
SDA and SCL Fall Time
From 70% to 30% of VDD
20 +
0.1 x Cb
300
ns
Cb
Capacitive Loading of SDA or SCL
Total on-chip and off-chip
10
400
pF
Rpu
SDA and SCL Bus Pull-Up
Resistor Off-Chip
Maximum is determined by tR and tF
For Cb = 400pF, max is about 2k
Ω to ~2.5kΩ
For Cb = 40pF, max is about 15k
Ω to ~20kΩ
1k
Ω
NOTES:
2. IRQ and fOUT Inactive.
3. LPMODE = 0 (default).
4. In order to ensure proper timekeeping, the VDD SR- specification must be followed.
5. Typical values are for T = +25°C and 3.3V supply voltage.
6. Parameters with MIN and/or MAX limits are 100% tested at +25°C, unless otherwise specified. Temperature limits established by
characterization and are not production tested.
7. Limits should be considered typical and are not production tested.
8. These are I2C specific parameters and are not tested, however, they are used to set conditions for testing devices to validate
specification.
9. Parameters are for 10 Ld MSOP package only.
Serial Interface Specifications Over the recommended operating conditions, unless otherwise specified. (Continued)
SYMBOL
PARAMETER
TEST CONDITIONS
MIN
(Note 6)
TYP
(Note 5)
MAX
(Note 6)
UNITS
NOTES
ISL12082
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